MCQOPTIONS
Bookmark
Saved Bookmarks
→
Vlsi
→
Characteristics Npn Bipolar Transistors in Vlsi
→
The N+M bit test pattern generator has __________..
1.
The N+M bit test pattern generator has __________ different patterns produced.
A.
2(N+M)
B.
2N+M
C.
2NM
D.
2M+N
Answer» C. 2NM
Show Answer
Discussion
No Comment Found
Post Comment
Related MCQs
The detectability profile can be determined using
Which requires more number of cycles for 100% fault coverage?
Test patterns produced by ________ have both high and least toggle rates.
__________ are used along with flip-flops to build accumulators.
The N+M bit test pattern generator has __________ different patterns produced.
The test pattern generator which uses a shift register along with LFSR is of __________ bits.
WHICH_REQUIRES_MORE_NUMBER_OF_CYCLES_FOR_100%_FAULT_COVERAGE??$
The detectability profile can be determined using$
Which method is easiest to test?
Which method does not have carry out?
Reply to Comment
×
Name
*
Email
*
Comment
*
Submit Reply