_____ of faults are easier to detect. – McqOptions

MCQOPTIONS

Saved Bookmarks

→ Vlsi
→ Characteristics Npn Bipolar Transistors in Vlsi
→ _____ of faults are easier to detect...

1.	_____ of faults are easier to detect.
A.	50%
B.	60%
C.	70%
D.	80%
Answer» E.

Discussion

No Comment Found

Related MCQs

Oxide breakdown occurs due to
Hot carrier injection causes
_____ of faults are easier to detect.
Test pattern generation is assisted using
______ of the area is dedicated for testability.
Circuit nodes cannot be probed for monitoring or excitation.
______OF_FAULTS_ARE_EASIER_TO_DETECT?$
Oxide breakdown occurs due to$
Hot carrier injection causes$
Which model is used for pc board testing?

Related Topics

Characteristics Npn Bipolar Transistors in Vlsi

System Considerations in Vlsi

Bicmos Logic Gates in Vlsi

Metal Oxide Semiconductor Transistor in Vlsi

Automatic Test Pattern Generation in Vlsi

Device Modelling Performance Estimation in Vlsi

Sheet Resistance Mos Inverters in Vlsi

Testing Sequential Logic in Vlsi

Floor Layout in Vlsi

Gaas Mesfet Logics in Vlsi

Recent Visits

Reply to Comment

Name *

Email *

Comment *

© Copyright 2025 McqOptions. All rights reserved.

Terms & Conditions
Privacy Policy
Disclaimer

Support: admin@mcqoptions.com