Explore topic-wise MCQs in Vlsi.

This section includes 3 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.

1.

Which method is used for external functional testing?

A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. pseudo-random test pattern method
Answer» D. pseudo-random test pattern method
Discussion
2.

A n-bit counter produces ______ number of total input combinations.

A. 2<sup>(n-1) </sup>
B. 2<sup>(n+1)</sup>
C. 2<sup>n</sup>
D. 2n
Answer» D. 2n
Discussion
3.

Which is known as the stored test pattern method?

A. deterministic test pattern
B. algorithmic test pattern
C. random test pattern
D. exhaustive test pattern
Answer» B. algorithmic test pattern
Discussion