MCQOPTIONS
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MCQOPTIONS
This section includes 6 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.
| 1. |
The detectability profile can be determined using |
| A. | D algorithm |
| B. | Cellular automata |
| C. | LFSR |
| D. | Random testing |
| Answer» B. Cellular automata | |
| 2. |
Which requires more number of cycles for 100% fault coverage? |
| A. | internal feedback LFSR |
| B. | external feedback LFSR |
| C. | weighted LFSR |
| D. | ca |
| Answer» C. weighted LFSR | |
| 3. |
Test patterns produced by ________ have both high and least toggle rates. |
| A. | random pattern generator |
| B. | counters |
| C. | LFSR |
| D. | CA |
| Answer» C. LFSR | |
| 4. |
__________ are used along with flip-flops to build accumulators. |
| A. | adders |
| B. | multipliers |
| C. | buffers |
| D. | AND gates |
| Answer» B. multipliers | |
| 5. |
The N+M bit test pattern generator has __________ different patterns produced. |
| A. | 2<sup>(N+M)</sup> |
| B. | 2<sup>N</sup>+M |
| C. | 2N<sup>M</sup> |
| D. | 2<sup>M+N</sup> |
| Answer» C. 2N<sup>M</sup> | |
| 6. |
The test pattern generator which uses a shift register along with LFSR is of __________ bits. |
| A. | N |
| B. | M |
| C. | N+M |
| D. | N*M |
| Answer» D. N*M | |