MCQOPTIONS
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MCQOPTIONS
This section includes 17 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.
| 1. |
The detectability profile can be determined using |
| A. | D algorithm |
| B. | Cellular automata |
| C. | LFSR |
| D. | Random testing |
| Answer» B. Cellular automata | |
| 2. |
Which requires more number of cycles for 100% fault coverage? |
| A. | internal feedback LFSR |
| B. | external feedback LFSR |
| C. | weighted LFSR |
| D. | ca |
| Answer» C. weighted LFSR | |
| 3. |
Test patterns produced by ________ have both high and least toggle rates. |
| A. | random pattern generator |
| B. | counters |
| C. | LFSR |
| D. | CA |
| Answer» C. LFSR | |
| 4. |
__________ are used along with flip-flops to build accumulators. |
| A. | adders |
| B. | multipliers |
| C. | buffers |
| D. | AND gates |
| Answer» B. multipliers | |
| 5. |
The N+M bit test pattern generator has __________ different patterns produced. |
| A. | 2(N+M) |
| B. | 2N+M |
| C. | 2NM |
| D. | 2M+N |
| Answer» C. 2NM | |
| 6. |
The test pattern generator which uses a shift register along with LFSR is of __________ bits. |
| A. | N |
| B. | M |
| C. | N+M |
| D. | N*M |
| Answer» D. N*M | |
| 7. |
WHICH_REQUIRES_MORE_NUMBER_OF_CYCLES_FOR_100%_FAULT_COVERAGE??$ |
| A. | internal feedback LFSR |
| B. | external feedback LFSR |
| C. | weighted LFSR |
| D. | ca |
| Answer» C. weighted LFSR | |
| 8. |
The detectability profile can be determined using$ |
| A. | D algorithm |
| B. | Cellular automata |
| C. | LFSR |
| D. | Random testing |
| Answer» B. Cellular automata | |
| 9. |
Which method is easiest to test? |
| A. | LFSR |
| B. | Counter |
| C. | CA |
| D. | Weighted LFSR |
| Answer» B. Counter | |
| 10. |
Which method does not have carry out? |
| A. | LFSR |
| B. | CA |
| C. | Counters |
| D. | Random sequence generator |
| Answer» D. Random sequence generator | |
| 11. |
Test patterns produced by ______ have both high and least toggle rates |
| A. | random pattern generator |
| B. | counters |
| C. | LFSR |
| D. | CA |
| Answer» C. LFSR | |
| 12. |
Which can be used to check the working of accumulator? |
| A. | adder |
| B. | shifter |
| C. | multiplier |
| D. | counter |
| Answer» E. | |
| 13. |
What is the desirable constant value to be used with the initial values? |
| A. | 0 |
| B. | 1 |
| C. | N |
| D. | M |
| Answer» C. N | |
| 14. |
_____ are used along with flip-flops to build accumulators |
| A. | adders |
| B. | multipliers |
| C. | buffers |
| D. | AND gates |
| Answer» B. multipliers | |
| 15. |
Which property can prevent high fault coverage? |
| A. | fault limit |
| B. | clock fault |
| C. | linear interloading |
| D. | linear dependencies |
| Answer» E. | |
| 16. |
The N+M bit test pattern generator has _____ different patterns produced |
| A. | 2<sup>(N+M)</sup> |
| B. | 2<sup>N</sup>+M |
| C. | 2N<sup>M </sup> |
| D. | 2<sup>M+N </sup> |
| Answer» C. 2N<sup>M </sup> | |
| 17. |
The test pattern generator which uses a shift register along with LFSR is of _____ bits |
| A. | N |
| B. | M |
| C. | N+M |
| D. | N*M |
| Answer» D. N*M | |