MCQOPTIONS
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MCQOPTIONS
This section includes 5 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.
| 1. |
Which method has more area overhead? |
| A. | random test pattern |
| B. | pseudo random test pattern |
| C. | algorithmic test pattern |
| D. | deterministic test pattern |
| Answer» C. algorithmic test pattern | |
| 2. |
AND gate is used to ensure whether the test patterns have sufficient clock cycles. |
| A. | true |
| B. | false |
| Answer» C. | |
| 3. |
Initialization of the test pattern generator to all 1 s generate |
| A. | global reset |
| B. | clear |
| C. | toggle |
| D. | buffer |
| Answer» B. clear | |
| 4. |
The circuit which incorporates _______ can be tested with weighted pseudo-random test pattern. |
| A. | preset |
| B. | reset |
| C. | clear |
| D. | break |
| Answer» B. reset | |
| 5. |
Large AND function will produce _______ infrequently. |
| A. | logic 0 |
| B. | logic 0 and logic 1 |
| C. | logic 1 |
| D. | neither logic 0 or 1 |
| Answer» D. neither logic 0 or 1 | |