 
			 
			MCQOPTIONS
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				This section includes 13 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.
| 1. | Which was employed as the first level capping material? | 
| A. | SiO2 | 
| B. | SiO | 
| C. | Si3N4 | 
| D. | Si2N4 | 
| Answer» B. SiO | |
| 2. | Which has the greatest mismatch? | 
| A. | Si | 
| B. | Ga | 
| C. | GaAs | 
| D. | SiO2 | 
| Answer» E. | |
| 3. | Stress at the interface cannot arise from | 
| A. | lattice mismatch | 
| B. | intrinsic stress | 
| C. | thermal mismatch | 
| D. | pressure mismatch | 
| Answer» E. | |
| 4. | The channel resistance is high for | 
| A. | source contact | 
| B. | drain contact | 
| C. | gate contact | 
| D. | source and drain contacts | 
| Answer» E. | |
| 5. | Implantation of ________ is done for the formation of source and drain. | 
| A. | n- layer | 
| B. | n+ layer | 
| C. | p- layer | 
| D. | p+ layer | 
| Answer» C. p- layer | |
| 6. | Formation of n-active layer is achieved by | 
| A. | indirent ion implantation | 
| B. | direct ion implantation | 
| C. | liquifying | 
| D. | wafering | 
| Answer» C. liquifying | |
| 7. | In GaAs technology, deposited dielectric films brings about | 
| A. | passivation | 
| B. | combination | 
| C. | decomposition | 
| D. | diffusion | 
| Answer» B. combination | |
| 8. | Stable native oxide was produced by | 
| A. | oxidation of silicon | 
| B. | oxidation of gallium | 
| C. | oxidation of boron | 
| D. | oxidation of aluminium | 
| Answer» B. oxidation of gallium | |
| 9. | Threshold voltage can be varied by | 
| A. | varying impurity concentration | 
| B. | varying doping level | 
| C. | varying channel length | 
| D. | varying source voltage | 
| Answer» C. varying channel length | |
| 10. | Which devices are fabricated using planar process? | 
| A. | enhancement mode MESFET | 
| B. | depletion mode MESFET | 
| C. | enhancement mode MOSFET | 
| D. | depletion mode MOSFET | 
| Answer» C. enhancement mode MOSFET | |
| 11. | The sequence of the steps followed in fabrication of GaAs is | 
| A. | ii, iii, i, iv | 
| B. | i, ii, iii, iv | 
| C. | iii, i, ii, iv | 
| D. | iv, i, ii, iiiView Answer | 
| Answer» D. iv, i, ii, iiiView Answer | |
| 12. | Wafers in GaAs fabrication are thermally unstable. | 
| A. | true | 
| B. | false | 
| Answer» C. | |
| 13. | Gallium arsenide crystals are grown from | 
| A. | boron oxide | 
| B. | silicon oxide | 
| C. | silicon nitride | 
| D. | boron nitride | 
| Answer» E. | |