2721+ Topic-wise solved MCQs for:
Vlsi

  1. 101. Lfsr
  2. 102. Lfsr 1
  3. 103. Optimization Inverters 1
  4. 104. CMOS Fabrication
  5. 105. Design Rules and Layout-2
  6. 106. System Considerations
  7. 107. nMOS Inverter
  8. 108. nMOS and CMOS Fabrication
  9. 109. Optimization Inverters
  10. 110. Pseudo Random Test Patterns
  11. 111. Guidelines Testability
  12. 112. Scaling Factors
  13. 113. Limitations Scaling
  14. 114. Pseudo Random Test Patterns 1
  15. 115. Limitations Scaling 1
  16. 116. Guidelines Testability 1
  17. 117. Scaling Factors 1
  18. 118. Area Capacitance
  19. 119. Guidelines for Testability -3
  20. 120. Inverter Delays
  21. 121. Latch-up in CMOS
  22. 122. Propagation Delays
  23. 123. Technology Development in VLSI Structures-1
  24. 124. VLSI Design
  25. 125. Cmos Logic Gates
  26. 126. BiCMOS Technology
  27. 127. Design Rules and Layout-1
  28. 128. Doping Process of GA-1
  29. 129. Limitations of Scaling -2
  30. 130. MESFET Design-1
  31. 131. MESFET Design-2
  32. 132. Noise Margin
  33. 133. Metal Oxide Semiconductor Transistor
  34. 134. Metal Oxide Semiconductor Transistor
  35. 135. Metal Oxide Semiconductor Transistor 1
  36. 136. Metal Oxide Semiconductor Transistor 2
  37. 137. BiCMOS Inverters
  38. 138. CMOS Logics
  39. 139. Characteristics of npn Bipolar Transistors
  40. 140. Design Processes
  41. 141. Doping Process of GA-2
  42. 142. MOS Circuit Scaling 1
  43. 143. Metal Oxide Semiconductor (MOS) Transistor 1
  44. 144. Sheet Resistance
  45. 145. Submicron CMOS
  46. 146. Automatic Test Pattern Generation
  47. 147. Device Modelling and Performance Estimation -1
  48. 148. GaAs Fabrication -3
  49. 149. MESFET
  50. 150. Optimization of Inverters-1

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