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Characteristics Npn Bipolar Transistors
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Delay fault is considered as:
1.
Delay fault is considered as:
A.
Electrical fault
B.
Logical fault
C.
Physical defect
D.
None of the Mentioned
Answer» C. Physical defect
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The circuits with poor observability are:
The poor controllability circuits are:
The ease with which the controller determines signal value at any node by setting input values is known as:
The ease with which the controller establishes specific signal value at each node by setting input values is known as:
The defect present in the following MOSFET is:
THE_EASE_WITH_WHICH_THE_CONTROLLER_DETERMINES_SIGNAL_VALUE_AT_ANY_NODE_BY_SETTING_INPUT_VALUES_IS_KNOWN_AS:?$
The circuits with poor observability are:$
The poor controllability circuits are:$
LSSD stands for:
Divide and Conquer approach to large and complex circuits for testing is found in:
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