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This section includes 21 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.
1. |
In MESFET for gate _____ junction is used. |
A. | pnp junction |
B. | npn junction |
C. | schottky junction |
D. | n junction |
Answer» D. n junction | |
2. |
As the separation between metal-semiconductor surface is reduced, induction charge |
A. | increases |
B. | decreases |
C. | remains constant |
D. | is not affected |
Answer» B. decreases | |
3. |
Schottky barrier is created due to the difference in |
A. | voltages |
B. | thickness |
C. | work function |
D. | density |
Answer» D. density | |
4. |
The MESFET has maximum |
A. | gate to drain voltage |
B. | gate to source voltage |
C. | source voltage |
D. | drain voltage |
Answer» C. source voltage | |
5. |
A highly doped thick channel exhibits _______ threshold voltage. |
A. | smaller negative |
B. | smaller positive |
C. | larger negative |
D. | larger positive |
Answer» D. larger positive | |
6. |
D type and E type MESFETs operates by ________ of existing doped channel. |
A. | depletion |
B. | enhancement |
C. | e type MESFET |
D. | d type MESFET |
Answer» B. enhancement | |
7. |
The gallium arsenide field effect transistor is ________ majority carrier device. |
A. | bulk current insulation |
B. | bulk current conduction |
C. | bulk voltage insulation |
D. | bulk voltage conduction |
Answer» C. bulk voltage insulation | |
8. |
THE_MESFET_HAS_MAXIMUM?$ |
A. | gate to drain voltage |
B. | gate to source voltage |
C. | source voltage |
D. | drain voltage |
Answer» C. source voltage | |
9. |
As the separation between metal-semiconductor surface is reduced, induction charge$ |
A. | increases |
B. | decreses |
C. | remains constant |
D. | is not affected |
Answer» B. decreses | |
10. |
Schottky barrier is created due to difference in$ |
A. | voltages |
B. | thickness |
C. | work function |
D. | density |
Answer» D. density | |
11. |
MESFET is constructed in |
A. | SiC |
B. | InP |
C. | GaAs |
D. | all of the mentioned |
Answer» E. | |
12. |
In MESFET for gate, _____ junction is used |
A. | pnp junction |
B. | npn junction |
C. | schottky junction |
D. | n junction |
Answer» D. n junction | |
13. |
A highly doped thick channel exhibits _______ threshold voltag? |
A. | smaller negative |
B. | smaller positive |
C. | larger negative |
D. | larger positive |
Answer» D. larger positive | |
14. |
The threshold voltage cannot be determined using |
A. | concentration density |
B. | channel thickness |
C. | implanted impurity |
D. | channel depth |
Answer» E. | |
15. |
Which is ON device? |
A. | e type MESFET |
B. | d type MESFET |
C. | depletion |
D. | enhancement |
Answer» C. depletion | |
16. |
D type and E type MESFETs opearates by ________ of existing doped channel |
A. | depletion |
B. | enhancement |
C. | e type MESFET |
D. | d type MESFET |
Answer» B. enhancement | |
17. |
Which MOSFET contains schottky diode? |
A. | GaAs |
B. | Ga |
C. | Si |
D. | SiO2 |
Answer» B. Ga | |
18. |
Which region is heavily doped? |
A. | drain |
B. | gate |
C. | n-region |
D. | p-region |
Answer» B. gate | |
19. |
How many masking stages does fabrication of GaAs FET require? |
A. | five |
B. | four |
C. | ten |
D. | eight |
Answer» E. | |
20. |
Method used for fabrication of GaAs FET is |
A. | ion implantation |
B. | disposition |
C. | diffusion |
D. | conduction |
Answer» B. disposition | |
21. |
The gallium arsenide field effect transistor is ________ majority carrier device |
A. | bulk current insulation |
B. | bulk current conduction |
C. | bulk voltage insulation |
D. | bulk voltage conduction |
Answer» C. bulk voltage insulation | |