MCQOPTIONS
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MCQOPTIONS
This section includes 3 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.
| 1. |
Which method is used for external functional testing? |
| A. | exhaustive test pattern method |
| B. | pseudo-exhaustive test pattern method |
| C. | random test pattern method |
| D. | pseudo-random test pattern method |
| Answer» D. pseudo-random test pattern method | |
| 2. |
A n-bit counter produces ______ number of total input combinations. |
| A. | 2<sup>(n-1) </sup> |
| B. | 2<sup>(n+1)</sup> |
| C. | 2<sup>n</sup> |
| D. | 2n |
| Answer» D. 2n | |
| 3. |
Which is known as the stored test pattern method? |
| A. | deterministic test pattern |
| B. | algorithmic test pattern |
| C. | random test pattern |
| D. | exhaustive test pattern |
| Answer» B. algorithmic test pattern | |