

MCQOPTIONS
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This section includes 26 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.
1. |
_______ is used to suppress unwanted conduction. |
A. | phosphorus |
B. | boron |
C. | silicon |
D. | oxygen |
Answer» C. silicon | |
2. |
SIlicon-di-oxide is a good insulator. |
A. | true |
B. | false |
Answer» B. false | |
3. |
Interconnection pattern is made on ____________ |
A. | polysilicon layer |
B. | silicon-di-oxide layer |
C. | metal layer |
D. | diffusion layer |
Answer» D. diffusion layer | |
4. |
Contact cuts are made in ____________ |
A. | source |
B. | drain |
C. | metal layer |
D. | diffusion layer |
Answer» B. drain | |
5. |
In diffusion process ______ impurity is desired. |
A. | n type |
B. | p type |
C. | np type |
D. | none of the mentioned |
Answer» B. p type | |
6. |
Heavily doped polysilicon is deposited using ____________ |
A. | chemical vapour decomposition |
B. | chemical vapour deposition |
C. | chemical deposition |
D. | dry deposition |
Answer» C. chemical deposition | |
7. |
In nMOS fabrication, etching is done using ____________ |
A. | plasma |
B. | hydrochloric acid |
C. | sulphuric acid |
D. | sodium chloride |
Answer» B. hydrochloric acid | |
8. |
Which is the commonly used bulk substrate in nMOS fabrication? |
A. | silicon crystal |
B. | silicon-on-sapphire |
C. | phosphorus |
D. | silicon-di-oxide |
Answer» D. silicon-di-oxide | |
9. |
In nMOS device, gate material could be ____________ |
A. | silicon |
B. | polysilicon |
C. | boron |
D. | phosphorus |
Answer» C. boron | |
10. |
The photoresist layer is exposed to ____________ |
A. | Visible light |
B. | Ultraviolet light |
C. | Infra red light |
D. | LED |
Answer» C. Infra red light | |
11. |
______________ impurities are added to the wafer of the crystal. |
A. | n impurities |
B. | p impurities |
C. | siicon |
D. | crystal |
Answer» C. siicon | |
12. |
nMOS fabrication process is carried out in ____________ |
A. | thin wafer of a single crystal |
B. | thin wafer of multiple crystals |
C. | thick wafer of a single crystal |
D. | thick wafer of multiple crystals |
Answer» B. thin wafer of multiple crystals | |
13. |
CONTACT_CUTS_ARE_MADE_IN?$ |
A. | source |
B. | drain |
C. | metal layer |
D. | diffusion layer |
Answer» B. drain | |
14. |
SIlicon-di-oxide is a good insulator.$ |
A. | true |
B. | false |
Answer» B. false | |
15. |
Interconnection pattern is made on$ |
A. | polysilicon layer |
B. | silicon-di-oxide layer |
C. | metal layer |
D. | diffusion layer |
Answer» D. diffusion layer | |
16. |
Which is used for the interconnection? |
A. | boron |
B. | oxygen |
C. | aluminium |
D. | silicon |
Answer» D. silicon | |
17. |
_______ is used to suppress unwanted conduction |
A. | phosporus |
B. | boron |
C. | silicon |
D. | oxygen |
Answer» C. silicon | |
18. |
In diffusion process, ______ impurity is desire? |
A. | n type |
B. | p type |
Answer» B. p type | |
19. |
Heavily doped polysilicon is deposited using |
A. | chemical vapour decomposition |
B. | chemical vapour deposition |
C. | chemical deposition |
D. | dry deposition |
Answer» C. chemical deposition | |
20. |
In nMOS fabrication, etching is done using |
A. | plasma |
B. | hydrochloric acid |
C. | sulphuric acid |
D. | sodium chloride |
Answer» B. hydrochloric acid | |
21. |
The commonly used bulk substrate in nMOS fabrication is |
A. | silicon crystal |
B. | silicon-on-sapphire |
C. | phosporus |
D. | silicon-di-oxide |
Answer» D. silicon-di-oxide | |
22. |
In nMOS device, gate material could be |
A. | silicon |
B. | polysilicon |
C. | boron |
D. | phosporus |
Answer» C. boron | |
23. |
The photoresist layer is exposed to |
A. | visible light |
B. | ultraviolet light |
C. | infra red light |
D. | LED |
Answer» C. infra red light | |
24. |
What kind of substrate is provided above the barrier to dopants? |
A. | insulating |
B. | conducting |
C. | silicon |
D. | semi conducting |
Answer» B. conducting | |
25. |
_____ impurities are added to the wafer of the crystal |
A. | n impurities |
B. | p impurities |
C. | siicon |
D. | crystal |
Answer» C. siicon | |
26. |
nMOS fabrication process is carried out in |
A. | thin wafer of a single crystal |
B. | thin wafer of multiple crystals |
C. | thick wafer of a single crystal |
D. | thick wafer of multiple crystals |
Answer» B. thin wafer of multiple crystals | |