

MCQOPTIONS
Saved Bookmarks
This section includes 51 Mcqs, each offering curated multiple-choice questions to sharpen your Power Electronics knowledge and support exam preparation. Choose a topic below to get started.
1. |
For n-channel depletion MOSFET, the highest trans-conductance gain for a small signal is at |
A. | VGS = 0 V |
B. | VGS = Vp |
C. | VGS = |Vp| |
D. | VGS = -Vp |
Answer» B. VGS = Vp | |
2. |
For a given n-MOS capacitor with substrate doping of NA=1017 cm−3, oxide thickness 20 nm, εox= 3.9 εo the values of oxide capacitance and flat band capacitance are respectively given as(use εo = 8.85×10−14 F cm−1): |
A. | 142 nF/cm2 and 172 nF/cm2 |
B. | 172 nF/cm2 and 142 nF/cm2 |
C. | 71 nF/cm2 and 86 nF/cm2 |
D. | 86 nF/cm2 and 71 nF/cm2 |
Answer» C. 71 nF/cm2 and 86 nF/cm2 | |
3. |
Match List-I with List-II:List-I(Analog Devices)List-II(I / P impedances)a)BJTi)> 1012 Ωb)MOSFETii)> 1010 Ωc)JFETiii)> 108 Ωd)MESFETiv)< 104 ΩChoose the correct option from those given below: |
A. | a-iv; b-iii; c-i; d-ii |
B. | a-i; b-ii; c-iii; d-iv |
C. | a-iii; b-i; c-ii; d-iv |
D. | a-iv; b-ii; c-iii; d-i |
Answer» E. | |
4. |
An NMOS has Id = 5 mA, Vgs = 2 V, Vds = 4 V and Vt = 0.8 V. If the thickness of oxide is 500 A° , the aspect ratio of device at room temperature is |
A. | 1.5 |
B. | 14 |
C. | 25 |
D. | 35 |
Answer» D. 35 | |
5. |
Barrier height in a metal-semiconductor contact can easily be estimated from |
A. | \(\left( {\frac{1}{C}} \right)\) versus V curve |
B. | \(\left( {\frac{1}{{{C^2}}}} \right)\) versus V curve |
C. | \(\left( {\frac{1}{C}} \right)\) versus I curve |
D. | \(\left( {\frac{1}{{{C^2}}}} \right)\) versus I curve |
Answer» C. \(\left( {\frac{1}{C}} \right)\) versus I curve | |
6. |
Consider the following statements for a metal oxide semiconductor field-effect transistor(MOSFET):P: As channel length reduces, OFF-state current increases.Q: As channel length reduces, output resistance increases.R: As channel length reduces, threshold voltage remains constant.S: As channel length reduces, ON current increases.Which of the above statements is INCORRECT? |
A. | P and Q |
B. | P and S |
C. | Q and R |
D. | R and S |
Answer» D. R and S | |
7. |
Both transistor T1 and T2 in figure have a threshold voltage of 1V. The device parameter K1 and K2 of T1 and T2 are 36 μAN2 and 9 μA/V2 respectively. The o/p voltage V0 is |
A. | 1V |
B. | 2V |
C. | 3V |
D. | 4V |
Answer» D. 4V | |
8. |
For the n-channel MOS transistor shown in the figure, the threshold voltage VTh is 0.8 V. Neglect channel length modulation effects. When the drain voltage VD = 1.6 V, the drain current ID was found to be 0.5 mA. If VD is adjusted to be 2 V by changing the values of r and VDD, the new value of ID (in mA) is |
A. | 0.625 |
B. | 0.75 |
C. | 1.125 |
D. | 1.5 |
Answer» D. 1.5 | |
9. |
Given, Vgs is the gate-source voltage, Vds is the drain source voltage, and Vth is the threshold voltage of an enhancement type NMOS transistor, the conditions for transistor to be biased in saturation are |
A. | Vgs < Vth; Vds ≥ Vgs - Vth |
B. | Vgs > Vth; Vds ≥ Vgs – Vth |
C. | Vgs > Vth; Vds ≤ Vgs – Vth |
D. | Vgs < Vth; Vds ≤ Vgs – Vth |
Answer» C. Vgs > Vth; Vds ≤ Vgs – Vth | |
10. |
Power dissipation is negligibly small in: |
A. | SCR |
B. | BJT |
C. | MOSFET |
D. | CMOS |
Answer» E. | |
11. |
An enhancement MOSFET of threshold voltage 3 V is being used in the sample and hold circuit given below. Assume that the substrate of the MOS device is connected to – 10 V. If the input voltage VI lies between ± 10 V, the minimum and the maximum values of VG required for proper sampling and holding respectively, are |
A. | 3 V and -3 V |
B. | 10 V and – 10 V |
C. | 13 V and -7 V |
D. | 10 V and – 13 V |
Answer» D. 10 V and – 13 V | |
12. |
A standard CMOS inverter is designed with equal rise and fall times (βn = βp). If the width of the P MOS transistor in the inverter is increased, what would be the effect on the LOW noise margin (NML) and the HIGH noise margin (NMH) ? |
A. | NML increases and NMH decreases |
B. | NML decreases and NMH increases |
C. | Both NML and NMH increase |
D. | No change in the noise margins |
Answer» B. NML decreases and NMH increases | |
13. |
A switched mode power supply operating at 20 kHz to 100 kHz range uses as the main switching element is __________. |
A. | Thyristor |
B. | MOS FET |
C. | Triac |
D. | UJT |
Answer» C. Triac | |
14. |
In the given circuit, S1 switch remains closed and S2 remains open for a long time. At t = 0, S1 opens and S2 closes and remain in this position for a long time. Find drain current for t < 0 and t 0 respectively if, μnCox = 100 μA/V2 and Aspect ratio = 2. |
A. | 600 μA, 0 μA |
B. | 600 μA, 25 μA |
C. | 600 μA, -25 μA |
D. | 0 μA, 600 μA |
Answer» B. 600 μA, 25 μA | |
15. |
MOSFET is a |
A. | Current controlled current source |
B. | Current controlled voltage source |
C. | Voltage controlled current source |
D. | Voltage controlled voltage source |
Answer» D. Voltage controlled voltage source | |
16. |
A CMOS amplifier when compared to an N–channel MOSFET, has the advantage of |
A. | Higher cut–off frequency |
B. | Higher voltage gain |
C. | Higher current gain |
D. | Lower drain current from the power supply, thereby less dissipation |
Answer» E. | |
17. |
Body effect in MOSFET’s results in |
A. | increase in the value of transconductance |
B. | change in the value of threshold voltage |
C. | decrease in the value of transconductance |
D. | increase in the value of output |
Answer» C. decrease in the value of transconductance | |
18. |
In a MOSFET, SiO2 breaks down breaks down at electric field of the order of 5 × 106 V/cm. For a gate oxide thickness 1000 Angstroms and channel thickness of 2 μm, what is the maximum VGS it can withstand? |
A. | 5 V |
B. | 10 V |
C. | 100 V |
D. | None of the above |
Answer» E. | |
19. |
In the ______ region, a transistor act as closed switch. |
A. | Inverse active region |
B. | Saturation |
C. | Cut-off region |
D. | Active region |
Answer» C. Cut-off region | |
20. |
In a p-type Si at 300 K and Na = 8 × 1015 cm-3, the variation of space-charge density in the semiconductor as a function of surface potential is plotted. Then select the true statement for the weak inversion region. Given that ps and ns are hole and electron concentrations at the surface. |
A. | ps > Na |
B. | ns < Na and ns > ps |
C. | ns < Na and ps < Na |
D. | ns > Na |
Answer» C. ns < Na and ps < Na | |
21. |
Identify the device based on the given symbol. |
A. | N-channel JFET |
B. | P-channel JFET |
C. | N-channel MOSFET |
D. | P-channel MOSFET |
Answer» B. P-channel JFET | |
22. |
For an n-channel MOSFET, if conduction parameter (kn) is 0.249 mA/V2, gate to source voltage VQS is 2VTN where VTN = 0.75V. The current will be |
A. | 0.160 mA |
B. | 0.150 mA |
C. | 0.140 mA |
D. | 0.170 mA |
Answer» D. 0.170 mA | |
23. |
Conductivity modulation is a phenomenon which occur in |
A. | Power MOSFET |
B. | GTO thyristor |
C. | IGBT |
D. | Power bipolar transistor |
Answer» B. GTO thyristor | |
24. |
A high gain MESFET packaged device of case-to-channel thermal resistance of the device is 4.5°C/Watt provides 8 W RF output power taking 20 W DC power. What will be the channel temperature of the device if the case temperature of the device maintained at 55°C? |
A. | 109°C |
B. | 145°C |
C. | 59.5°C |
D. | 91°C |
Answer» B. 145°C | |
25. |
In the circuits shown, the threshold voltage of each nMOS transistor is 0.6 V. Ignoring the effect of channel length modulation and body bias, the values of Vout1 and Vout2, respectively, in volts, are |
A. | 1.8 and 1.2 |
B. | 2.4 and 2.4 |
C. | 1.8 and 2.4 |
D. | 2.4 and 1.2 |
Answer» D. 2.4 and 1.2 | |
26. |
For an ideal MS contact between a metal and a P-type semi conductor. The relation between barrier height \(q \; \phi_{B_pO}\)is given by |
A. | \(q \; \phi_{B_pO}=q(\phi_m - \chi)\) |
B. | \(q \; \phi_{B_pO}=\frac{Eg}{2}-q(\phi_m - \chi)\) |
C. | \(q \; \phi_{B_pO}=q(\chi-\phi_m)\) |
D. | \(q \; \phi_{B_pO}={Eg}-q(\phi_m - \chi)\) |
Answer» E. | |
27. |
Consider the following statements:1. Speed of operation of MOSFET is more than the speed of operation of SCR.2. SCRs have lower power loss than MOSFETs.3. The current in the conducting state can easily be controlled through the gate in SCR.4. MOSFET is not a current triggered device.The correct statements are |
A. | 1 and 4 only |
B. | 1 and 2 only |
C. | 2 and 3 only |
D. | 1, 2, 3 and 4 |
Answer» B. 1 and 2 only | |
28. |
A gate to drain-connected enhancement mode MOSFET is an example of |
A. | an active load |
B. | a switching device |
C. | a three-terminal device |
D. | a diode |
Answer» B. a switching device | |
29. |
Assuming that transistors M1 and M2 are identical and have a threshold voltage of 1 V, the state of transistors M1 and M2 are respectively |
A. | Saturation, Saturation |
B. | Linear, Linear |
C. | Linear, Saturation |
D. | Saturation, Linear |
Answer» D. Saturation, Linear | |
30. |
For a MOSFET satisfying the relationship VDS < VGS – VTH, where the drain voltage is VDS, the gate voltage is VGS, and the threshold voltage of the transistor is VTH, the transistor is said to operate in: |
A. | Pinch off |
B. | Saturation |
C. | Cut off |
D. | Triode region |
Answer» E. | |
31. |
Directions:The following question consist of two statements, one labelled as ‘Statement (I)’ and the other as ‘Statement (II)’. You are to examine these two statements carefully and select the answers to these items using the code given below:Statement (I): The gate of MOSFET is insulated from the body of FET by deposition of a very thin fragile layer of SiO2 over the substrate.Statement (II): The device is therefore called as an insulated gate field-effect transistor (IGFET).Code |
A. | Both Statement (I) and Statement (II) are individually true and Statement (II) is the correct explanation of Statement (I) |
B. | Both Statement (I and Statement (II) are individually true but Statement (II) is not the correct explanation of Statement (I) |
C. | Statement (I) is true but Statement (II) is false |
D. | Statement (I) is false but Statement (II) is true |
Answer» B. Both Statement (I and Statement (II) are individually true but Statement (II) is not the correct explanation of Statement (I) | |
32. |
In n-channel enhancement type MOSFET, as VGS is increased beyond the threshold level |
A. | Drain current will decrease |
B. | Density of free carriers in the induced channel will remain constant |
C. | Density of free carriers in the induced channel will decrease |
D. | Density of free carriers in the induced channel will increase |
Answer» E. | |
33. |
In a circuit shown in the figure, the transistors M1 and M2 are operating in saturation. The channel length modulation coefficients of both the transistors are non-zero. The transconductance of the MOSFETs M1 and M2 are gm1 and gm2, respectively, and the internal resistance of the MOSFETs M1 and M2 are r01 and r02, respectively.Ignoring the body effect, the ac small-signal voltage gain (∂Vout / ∂Vin) of the circuit is: |
A. | \(- {g_{m2}}\left( {\frac{1}{{{g_{m1}}}}||{r_{02}}} \right)\) |
B. | \(- {g_{m2}}\left( {\frac{1}{{{g_{m1}}}}||{r_{01}}||{r_{02}}} \right)\) |
C. | \(- {g_{m1}}\left( {\frac{1}{{{g_{m2}}}}||{r_{01}}||{r_{02}}} \right)\) |
D. | \(- {g_{m2}}\left( {r_{01}||{r_{02}}} \right)\) |
Answer» C. \(- {g_{m1}}\left( {\frac{1}{{{g_{m2}}}}||{r_{01}}||{r_{02}}} \right)\) | |
34. |
Match the following:a) The surface potential at the onset of strong inversioni) \(-\sqrt{2{{\epsilon }_{s}}q{{N}_{A}}\left[ V\left( y \right)+2{{\psi }_{B}} \right]}\)b) Charge in the inversion layerii) VD + 2ψBc) Charge in the depletion regioniii) \(2{{\psi }_{B}}+\sqrt{\frac{2{{\epsilon }_{s}}q{{N}_{A}}\left( 2{{\psi }_{B}} \right)}{{{C}_{i}}}}\)d) Threshold voltageiv) \(-\left[ {{V}_{G}}-{{\psi }_{s}}\left( y \right) \right]{{C}_{i}}+\sqrt{2{{\epsilon }_{s}}q{{N}_{A}}\left[ V\left( y \right)+2{{\psi }_{B}} \right]}\) |
A. | a-i, b-ii, c-iii, d-iv |
B. | a-ii, b-iv, c-i, d-iii |
C. | a-iii, b-i, c-iv, d-ii |
D. | a-iv, b-iii, c-ii, d-i |
Answer» C. a-iii, b-i, c-iv, d-ii | |
35. |
For an n-channel silicon MOSFET with 10 nm gate oxide thickness, the substrate sensitivity (∂VT/∂|VBS|) is found to be 50 mV/V at a substance voltage |VBS| = 2 V, where VT is the threshold voltage of the MOSFET. Assume that, |VBS| >> 2ϕB, where qϕB is the separation between the Fermi energy level EF and the intrinsic level Ei in the bulk. Parameters given areElectron charge (q) = 1.6 × 10-19 CVacuum permittivity (ε0) = 8.85 × 10-12 F/mRelative permittivity of silicon (εSi) = 12Relative permittivity of oxide (εox) = 4The doping concentration of the substrate is |
A. | 7.37 × 1015 cm-3 |
B. | 9.37 × 1015 cm-3 |
C. | 2.37 × 1015 cm-3 |
D. | 4.37 × 1015 cm-3 |
Answer» B. 9.37 × 1015 cm-3 | |
36. |
Assertion (A) : The drain induced barrier lowering and channel length modulation are some of the short channel effects in MOSFETReason (R): The cut-off frequency of a MOSFET is independent of gate to source and gate to drain capacitance. |
A. | Both (A) and (R) are true and (R) is the correct explanation of (A). |
B. | Both (A) and (R) are true, but (R) is not the correct explanation of (A) |
C. | (A) is true, but (R) is false |
D. | (A) false, but (R) is true |
Answer» D. (A) false, but (R) is true | |
37. |
For the given circuit, the Aspect ratio of M1 transistor is 20/0.5, \({I_{{D_1}}} = 200\mu A\), VTHO = 0.6 V, 2ϕF = 0.81 V, γ = 0.4 V2 and μnCox = 59.5 μA/V2. If Vin = 1.2 V, find the minimum value of aspect ratio of M2 transistor to remain saturated \(\left( {\sqrt {10} = 3.16} \right)\) |
A. | 92 |
B. | 195 |
C. | 280 |
D. | None of the above |
Answer» E. | |
38. |
Match the columns.SymbolDevice name1. a. JFET2. b. BJT3. c. IGFET4. d. Vacuum tube |
A. | 1 - d, 2 - b, 3 - a, 4 - c |
B. | 1 - c, 2 - b, 3 - a, 4 - d |
C. | 1 - b, 2 - d, 3 - a, 4 - c |
D. | 1 - a, 2 - b, 3 - d, 4 - c |
Answer» B. 1 - c, 2 - b, 3 - a, 4 - d | |
39. |
If n number of MOSFETs with identical W/L are connected in series, then equivalent W/L is given by: |
A. | (W/L*n) |
B. | (W/L)*n |
C. | (W/L)*n2 |
D. | (W/L)/(n2) |
Answer» B. (W/L)*n | |
40. |
An N-channel JFET has IDSS = 1 mA and VP = -8V. Its maximum transconductance is ________ |
A. | 4S |
B. | 0.00025 S |
C. | 0.2 S |
D. | 0.001 S |
Answer» C. 0.2 S | |
41. |
An n-channel enhancement mode MOSFET is biased at VGS > VTH and VDS > (VGS - VTH), where VGS is the gate-to-source voltage, VDS is the drain-to-source voltage and VTH is the threshold voltage. Considering channel length modulation effect to be significant, the MOSFET behaves as a |
A. | voltage source with zero output impedance |
B. | voltage source with non-zero output impedance |
C. | current source with finite output impedance |
D. | current source with infinite output impedance |
Answer» D. current source with infinite output impedance | |
42. |
Directions: The below item consists of two statements, one labelled as the 'Statement (I)' and the other as 'Statement (II)'. Examine these two statements carefully and select the answers to these items using the codes given below:Statement (I): Conduction takes place in an enhancement MOSFET only for gate voltages below the threshold level.Statement (II): In an enhancement MOSFET, a channel of semiconductor of the same type as the source and drain is induced in the substrate by a positive voltage applied to the gate.Codes: |
A. | Both Statement (I) and Statement (II) are individually true and Statement (II) is the correct explanation of Statement (I) |
B. | Both Statement (I) and Statement (II) are individually true but Statement (II) is NOT the correct explanation of Statement (I) |
C. | Statement (I) is true but Statement (II) is false |
D. | Statement (I) is false but Statement (II) is true |
Answer» E. | |
43. |
A MOSFET is biased at drain current of 0.5 mA. If μnCox = 100 μA/V2, W/L = 10 and λ = 0.1V-1, the intrinsic gain gmro will be. |
A. | 1 |
B. | 10 |
C. | 20 |
D. | 0.05 |
Answer» D. 0.05 | |
44. |
MOSFET operating in the saturation region behaves as: |
A. | Voltage source |
B. | Capacitor |
C. | Current source |
D. | Resistor |
Answer» D. Resistor | |
45. |
THE_OUTPUT_CHARACTERISTICS_OF_A_MOSFET,_IS_A_PLOT_OF?$ |
A. | Id as a function of Vgs with Vds as a parameter |
B. | Id as a function of Vds with Vgs as a parameter |
C. | Ig as a function of Vgs with Vds as a parameter |
D. | Ig as a function of Vds with Vgs as a parameter |
Answer» C. Ig as a function of Vgs with Vds as a parameter | |
46. |
IN_THE_TRANSFER_CHARACTERISTICS_OF_A_MOSFET,_THE_THRESHOLD_VOLTAGE_IS_THE_MEASURE_OF_THE?$ |
A. | minimum voltage to induce a n-channel/p-channel for conduction |
B. | minimum voltage till which temperature is constant |
C. | minimum voltage to turn off the device |
D. | none of the above mentioned is true |
Answer» B. minimum voltage till which temperature is constant | |
47. |
In the internal structure of a MOSFET, a parasitic BJT exists between th? |
A. | source & gate terminals |
B. | source & drain terminals |
C. | drain & gate terminals |
D. | there is no parasitic BJT in MOSFET |
Answer» C. drain & gate terminals | |
48. |
The controlling parameter in MOSFET is |
A. | Vds |
B. | Ig |
C. | Vgs |
D. | Is |
Answer» C. Vgs | |
49. |
The arrow on the symbol of MOSFET indicates |
A. | that it is a N-channel MOSFET |
B. | the direction of electrons |
C. | the direction of conventional current flow |
D. | that it is a P-channel MOSFET |
Answer» C. the direction of conventional current flow | |
50. |
Which of the following terminals does not belong to the MOSFET? |
A. | Drain |
B. | Gate |
C. | Base |
D. | Source |
Answer» D. Source | |