Explore topic-wise MCQs in Vlsi.

This section includes 13 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.

1.

Which method is used for external functional testing?

A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. pseudo-random test pattern method
Answer» D. pseudo-random test pattern method
Discussion
2.

A n-bit counter produces ______ number of total input combinations.

A. 2(n-1)
B. 2(n+1)
C. 2n
D. 2n
Answer» D. 2n
Discussion
3.

Which is known as the stored test pattern method?

A. deterministic test pattern
B. algorithmic test pattern
C. random test pattern
D. exhaustive test pattern
Answer» B. algorithmic test pattern
Discussion
4.

WHICH_METHOD_IS_USED_FOR_EXTERNAL_FUNCTIONAL_TESTING??$

A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. pseudo-random test pattern method
Answer» D. pseudo-random test pattern method
Discussion
5.

In which method sequences are repeatable?

A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. pseudo-random test pattern method
Answer» E.
Discussion
6.

Which method needs fault simulation?

A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. deterministic test pattern method
Answer» B. pseudo-exhaustive test pattern method
Discussion
7.

Which is not suitable for circuits having large N values?

A. exhaustive test pattern method
B. pseudo-exhaustive test pattern method
C. random test pattern method
D. deterministic test pattern method
Answer» B. pseudo-exhaustive test pattern method
Discussion
8.

Exhaustive test pattern also detects delay faults.

A. true
B. false
Answer» C.
Discussion
9.

Exhaustive test pattern determines

A. gate level faults
B. logic level faults
C. functional faults
D. structural faults
Answer» B. logic level faults
Discussion
10.

A n-bit counter produces ______ number of total input combinations

A. 2<sup>(n-1)</sup>
B. 2<sup>(n+1)</sup>
C. 2<sup>n </sup>
D. 2n
Answer» D. 2n
Discussion
11.

Which method uses finite state machine for developing the test pattern?

A. deterministic test pattern
B. algorithmic test pattern
C. random test pattern
D. exhaustive test pattern
Answer» C. random test pattern
Discussion
12.

Which is known as stored test pattern method?

A. deterministic test pattern
B. algorithmic test pattern
C. random test pattern
D. exhaustive test pattern
Answer» B. algorithmic test pattern
Discussion
13.

Which method is used to determine structural defects?

A. deterministic test pattern
B. algorithmic test pattern
C. random test pattern
D. exhaustive test pattern
Answer» B. algorithmic test pattern
Discussion