

MCQOPTIONS
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This section includes 24 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.
1. |
BJT gain should be ______ to avoid latch-up effect. |
A. | increased |
B. | decreased |
C. | should be maintained constant |
D. | changed randomly |
Answer» C. should be maintained constant | |
2. |
Latch-up is brought about by BJTs __________ |
A. | with positive feedback |
B. | with negative feedback |
C. | with no feedback |
D. | without BJT |
Answer» B. with negative feedback | |
3. |
Latch-up is the generation of __________ |
A. | low impedance path |
B. | high impedance path |
C. | low resistance path |
D. | high resistance path |
Answer» B. high impedance path | |
4. |
To reduce latch-up effect substrate resistance should be high. |
A. | true |
B. | false |
Answer» C. | |
5. |
The reduction in carrier lifetime brings about __________ |
A. | reduction in alpha |
B. | reduction in beta |
C. | reduction in current |
D. | reduction in voltage |
Answer» C. reduction in current | |
6. |
The parasitic PNP transistor has the effect of _______ carrier lifetime. |
A. | increasing |
B. | decreasing |
C. | exponentially decreasing |
D. | exponentially increasing |
Answer» C. exponentially decreasing | |
7. |
Which one of the following is the main factor for reducing the latch-up effect? |
A. | reduced p-well resistance |
B. | reduced n-well resistance |
C. | increased n-well resistance |
D. | increased p-well resistance |
Answer» C. increased n-well resistance | |
8. |
Which process produces a circuit which is less prone to latch-up effect? |
A. | CMOS |
B. | nMOS |
C. | pMOS |
D. | BiCMOS |
Answer» E. | |
9. |
Latch-up can be induced by __________ |
A. | incident radiation |
B. | reflected radiation |
C. | etching |
D. | diffracted radiation |
Answer» B. reflected radiation | |
10. |
In latch-up condition, parasitic component gives rise to __________ conducting path. |
A. | low resistance |
B. | high resistance |
C. | low capacitance |
D. | high capacitance |
Answer» B. high resistance | |
11. |
TO_REDUCE_LATCH-UP_EFFECT_SUBSTRATE_RESISTANCE_SHOULD_BE_HIGH.?$ |
A. | true |
B. | false |
Answer» C. | |
12. |
Latch-up is brought about by BJTs$ |
A. | with positive feedback |
B. | with negative feedback |
C. | with no feedback |
D. | without BJT |
Answer» B. with negative feedback | |
13. |
Latch-up is the generation of$ |
A. | low impedance path |
B. | high impedance path |
C. | low resistance path |
D. | high resistance path |
Answer» B. high impedance path | |
14. |
BJT gain should be ______ to avoid latch-up effect |
A. | increased |
B. | decreased |
C. | should be maintained constant |
D. | changed randomly |
Answer» C. should be maintained constant | |
15. |
Sudden transient in power can cause latch-up. |
A. | true |
B. | false |
Answer» B. false | |
16. |
The reduction in carrier lifetime brings abou? |
A. | reduction in alpha |
B. | reduction in beta |
C. | reduction in current |
D. | reduction in voltage |
Answer» C. reduction in current | |
17. |
The parasitic pnp transistor has the effect of _______ carrier lifetime |
A. | increasing |
B. | decreasing |
C. | exponentially decreasing |
D. | exponentially increasing |
Answer» C. exponentially decreasing | |
18. |
One of the factor in reducing the latch-up effect is |
A. | reduced p-well resistance |
B. | reduced n-well resistance |
C. | increased n-well resistance |
D. | increased p-well resistance |
Answer» C. increased n-well resistance | |
19. |
Which process produces circuit which are less prone to latch-up effect? |
A. | CMOS |
B. | nMOS |
C. | pMOS |
D. | BiCMOS |
Answer» E. | |
20. |
What can be introduced to reduce the latch-up effect? |
A. | latch-up rings |
B. | guard rings |
C. | latch guard rings |
D. | substrate rings |
Answer» C. latch guard rings | |
21. |
Substrate doping level should be decreased to avoid the latch-up effect. |
A. | true |
B. | false |
Answer» C. | |
22. |
How many transistors might bring up latch up effect in p-well structure? |
A. | two |
B. | three |
C. | one |
D. | four |
Answer» B. three | |
23. |
Latch-up can be induced by |
A. | incident radiation |
B. | reflected radiation |
C. | etching |
D. | diffracted radiation |
Answer» B. reflected radiation | |
24. |
In latch-up condition, parasitic component gives rise to __________ conducting path |
A. | low resistance |
B. | high resistance |
C. | low capacitance |
D. | high capacitance |
Answer» B. high resistance | |