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This section includes 16 Mcqs, each offering curated multiple-choice questions to sharpen your Analytical Instrumentation knowledge and support exam preparation. Choose a topic below to get started.
1. |
Given below is the diagram of energy dispersive system. Identify the unmarked component. |
A. | Lens |
B. | Specimen |
C. | Sample holder |
D. | Energy analyser |
Answer» C. Sample holder | |
2. |
Which of the following is the disadvantage of silicon semiconductor detector? |
A. | Low stable |
B. | Can be operated only at low temperatures |
C. | Have low count-rate |
D. | Low resolution |
Answer» C. Have low count-rate | |
3. |
In curved crystal arrangement, angular velocity of the crystal is twice that of the detector. |
A. | True |
B. | False |
Answer» C. | |
4. |
Which of the following can be done to avoid loss of intensities of X-rays due to the absorption of long wavelength X-rays? |
A. | Apparatus must be contained in a chamber |
B. | Air in the chamber must be replaced by helium |
C. | Inert gas atmosphere must be provided |
D. | Proper slits must be used |
Answer» C. Inert gas atmosphere must be provided | |
5. |
The crystal used as X-ray grating has _______ dimensional lattice arrays. |
A. | One |
B. | Two |
C. | Three |
D. | Four |
Answer» D. Four | |
6. |
WHICH_OF_THE_FOLLOWING_CAN_BE_DONE_TO_AVOID_LOSS_OF_INTENSITIES_OF_X-RAYS_DUE_TO_ABSORPTION_OF_LONG_WAVELENGTH_X-RAYS??$ |
A. | Apparatus must be contained in a chamber |
B. | Air in the chamber must be replaced by helium |
C. | Inert gas atmosphere must be provided |
D. | Proper slits must be used |
Answer» C. Inert gas atmosphere must be provided | |
7. |
Which of the following is the disadvantage of silicon semiconductor detector?$ |
A. | Low stable |
B. | Can be operated only at low temperatures |
C. | Have low count-rate |
D. | Low resolution |
Answer» C. Have low count-rate | |
8. |
In_curved_crystal_arrangement,_angular_velocity_of_the_crystal_is_twice_that_of_the_detector.$ |
A. | True |
B. | False |
Answer» C. | |
9. |
The crystal used as X-ray grating has _______ dimensional lattice arrays? |
A. | One |
B. | Two |
C. | Three |
D. | Four |
Answer» D. Four | |
10. |
The analysis of X-ray beam by diffraction is similar to spectrum analysis carried out with a diffraction grating. |
A. | True |
B. | False |
Answer» B. False | |
11. |
In Energy dispersive system, the energy level and the number of pulses is related to which of the following? |
A. | Amount of sample, element involved |
B. | Element involved, concentration of the element |
C. | Concentration of the element, element involved |
D. | Number of atoms, amount of sample |
Answer» C. Concentration of the element, element involved | |
12. |
Energy dispersive system uses which of the following detectors? |
A. | Optical detector |
B. | Semiconductor detector |
C. | Thermistor |
D. | Bolometer |
Answer» C. Thermistor | |
13. |
Which of the following components make use of a thin metal foil to isolate a nearly mono-energetic excitation beam? |
A. | Transmission-anode X-ray tube |
B. | Secondary fluorescence target |
C. | Slit |
D. | Filters |
Answer» E. | |
14. |
Which of the following does not make the X-ray tube nearly monochromatic? |
A. | Transmission-anode X-ray tube |
B. | Secondary fluorescence target |
C. | Slit |
D. | Filters |
Answer» D. Filters | |
15. |
Why is a mono-energetic radiation source required in X-ray fluorescent spectrometer? |
A. | To provide good sensitivity |
B. | To provide high accuracy |
C. | To provide a proper range |
D. | To reduce unwanted background |
Answer» E. | |
16. |
Which of the following components of the X-ray fluorescent spectrometer induces fluorescent radiation? |
A. | Excitation source |
B. | Energy analyser |
C. | X-ray spectrometer |
D. | Detection System |
Answer» B. Energy analyser | |