Explore topic-wise MCQs in Analytical Instrumentation.

This section includes 16 Mcqs, each offering curated multiple-choice questions to sharpen your Analytical Instrumentation knowledge and support exam preparation. Choose a topic below to get started.

1.

Given below is the diagram of energy dispersive system. Identify the unmarked component.

A. Lens
B. Specimen
C. Sample holder
D. Energy analyser
Answer» C. Sample holder
2.

Which of the following is the disadvantage of silicon semiconductor detector?

A. Low stable
B. Can be operated only at low temperatures
C. Have low count-rate
D. Low resolution
Answer» C. Have low count-rate
3.

In curved crystal arrangement, angular velocity of the crystal is twice that of the detector.

A. True
B. False
Answer» C.
4.

Which of the following can be done to avoid loss of intensities of X-rays due to the absorption of long wavelength X-rays?

A. Apparatus must be contained in a chamber
B. Air in the chamber must be replaced by helium
C. Inert gas atmosphere must be provided
D. Proper slits must be used
Answer» C. Inert gas atmosphere must be provided
5.

The crystal used as X-ray grating has _______ dimensional lattice arrays.

A. One
B. Two
C. Three
D. Four
Answer» D. Four
6.

WHICH_OF_THE_FOLLOWING_CAN_BE_DONE_TO_AVOID_LOSS_OF_INTENSITIES_OF_X-RAYS_DUE_TO_ABSORPTION_OF_LONG_WAVELENGTH_X-RAYS??$

A. Apparatus must be contained in a chamber
B. Air in the chamber must be replaced by helium
C. Inert gas atmosphere must be provided
D. Proper slits must be used
Answer» C. Inert gas atmosphere must be provided
7.

Which of the following is the disadvantage of silicon semiconductor detector?$

A. Low stable
B. Can be operated only at low temperatures
C. Have low count-rate
D. Low resolution
Answer» C. Have low count-rate
8.

In_curved_crystal_arrangement,_angular_velocity_of_the_crystal_is_twice_that_of_the_detector.$

A. True
B. False
Answer» C.
9.

The crystal used as X-ray grating has _______ dimensional lattice arrays?

A. One
B. Two
C. Three
D. Four
Answer» D. Four
10.

The analysis of X-ray beam by diffraction is similar to spectrum analysis carried out with a diffraction grating.

A. True
B. False
Answer» B. False
11.

In Energy dispersive system, the energy level and the number of pulses is related to which of the following?

A. Amount of sample, element involved
B. Element involved, concentration of the element
C. Concentration of the element, element involved
D. Number of atoms, amount of sample
Answer» C. Concentration of the element, element involved
12.

Energy dispersive system uses which of the following detectors?

A. Optical detector
B. Semiconductor detector
C. Thermistor
D. Bolometer
Answer» C. Thermistor
13.

Which of the following components make use of a thin metal foil to isolate a nearly mono-energetic excitation beam?

A. Transmission-anode X-ray tube
B. Secondary fluorescence target
C. Slit
D. Filters
Answer» E.
14.

Which of the following does not make the X-ray tube nearly monochromatic?

A. Transmission-anode X-ray tube
B. Secondary fluorescence target
C. Slit
D. Filters
Answer» D. Filters
15.

Why is a mono-energetic radiation source required in X-ray fluorescent spectrometer?

A. To provide good sensitivity
B. To provide high accuracy
C. To provide a proper range
D. To reduce unwanted background
Answer» E.
16.

Which of the following components of the X-ray fluorescent spectrometer induces fluorescent radiation?

A. Excitation source
B. Energy analyser
C. X-ray spectrometer
D. Detection System
Answer» B. Energy analyser