In powder diffractometer, the sharpness of the lines is greatly determined by which of the following?

Thickness of the slit, amount of the sample

Quality of the sample, size of the slit

Quality of the slit, size of the sample

Thickness of the slit, amount of the sample

Number of slits, composition of the sample

In_powder_diffractometer,_the_sharpness_of_the_lines_is_greatly_determined_by_which_of_the_following?

Thickness of the slit, amount of the sample

Quality of the sample, size of the slit

Quality of the slit, size of the sample

Thickness of the slit, amount of the sample

Number of slits, composition of the sample

With the help of which of the following equations is the distance calculated from known wavelength of the source and measured angle?

Bragg‚Äö√Ñ√∂‚àö√ë‚àö¬•s equation

In powder method, the powder sample is contained in which of the following?

Thin walled glass capillary tubes

X-ray diffractometers provide ____________ information about the compounds present in a solid sample.

Either quantitative or qualitative

20 + Mcqs in Xray Diffractometers in Analytical Instrumentation Page 1 McqOptions

1.	In powder diffractometer, the sharpness of the lines is greatly determined by which of the following?
A.	Quality of the sample, size of the slit
B.	Quality of the slit, size of the sample
C.	Thickness of the slit, amount of the sample
D.	Number of slits, composition of the sample
Answer» C. Thickness of the slit, amount of the sample

Discussion

2.	In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture.
A.	True
B.	False
Answer» B. False

Discussion

3.	In Diffractometers, line intensities depend on ______ and kind of atomic reflection centres in each set of plates.
A.	Number
B.	Position
C.	Length
D.	Distance between lines
Answer» B. Position

Discussion

4.	Diffractometers are similar to which of the following?
A.	Optical grating spectrometer
B.	Prism spectrometer
C.	Photo multiplier
D.	Photovoltaic cell
Answer» B. Prism spectrometer

Discussion

5.	When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce a diffracted beam.
A.	True
B.	False
Answer» B. False

Discussion

6.	In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________
A.	Number, length
B.	Number, intensity
C.	Position, length
D.	Position, intensity
Answer» E.

Discussion

7.	With the help of which of the following equations is the distance calculated from a known wavelength of the source and measured angle?
A.	Coolidge equation
B.	Bragg’s equation
C.	Debye equation
D.	Scherrer equation
Answer» C. Debye equation

Discussion

8.	Using the powder method of diffractometers, which of the following can be determined?
A.	Percentage of K+
B.	Percentage of Na+ and Cl-
C.	Percentage of KBr and NaCl
D.	Percentage of Br-
Answer» D. Percentage of Br-

Discussion

9.	DIFFRACTOMETERS_ARE_SIMILAR_TO_WHICH_OF_THE_FOLLOWING??$
A.	Optical grating spectrometer
B.	Prism spectrometer
C.	Photo multiplier
D.	Photovoltaic cell
Answer» B. Prism spectrometer

Discussion

10.	In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture.$
A.	True
B.	False
Answer» B. False

Discussion

11.	In_Diffractometers,_line_intensities_depend_on________and_kind_of_atomic_reflection_centres_in_each_set_of_plates.$
A.	Number
B.	Position
C.	Length
D.	Distance between lines
Answer» B. Position

Discussion

12.	In_powder_diffractometer,_the_sharpness_of_the_lines_is_greatly_determined_by_which_of_the_following?
A.	Quality of the sample, size of the slit
B.	Quality of the slit, size of the sample
C.	Thickness of the slit, amount of the sample
D.	Number of slits, composition of the sample
Answer» C. Thickness of the slit, amount of the sample

Discussion

13.	When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce diffracted beam?
A.	True
B.	False
Answer» B. False

Discussion

14.	In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________.
A.	Number, length
B.	Number, intensity
C.	Position, length
D.	Position, intensity
Answer» E.

Discussion

15.	With the help of which of the following equations is the distance calculated from known wavelength of the source and measured angle?
A.	Coolidge equation
B.	Bragg‚Äö√Ñ√∂‚àö√ë‚àö¬•s equation
C.	Debye equation
D.	Scherrer equation
Answer» C. Debye equation

Discussion

16.	Which of the following is the most common instrument for photographic recording of diffraction patterns?
A.	Debye-Scherrer powder camera
B.	Gamma camera
C.	Geiger tube
D.	Scintillation counter
Answer» B. Gamma camera

Discussion

17.	In powder method, the powder sample is contained in which of the following?
A.	Thin walled glass capillary tubes
B.	Thin walled test tube
C.	Thin walled curvettes
D.	Thin walled flask
Answer» B. Thin walled test tube

Discussion

18.	Using powder method of diffractometers, which of the following can be determined?
A.	Percentage of K+
B.	Percentage of Na+ and Cl-
C.	Percentage of KBr and NaCl
D.	Percentage of Br-
Answer» D. Percentage of Br-

Discussion

19.	X-ray diffractometers provide ____________ information about the compounds present in a solid sample.
A.	Quantitative
B.	Qualitative
C.	Quantitative and qualitative
D.	Either quantitative or qualitative
Answer» D. Either quantitative or qualitative

Discussion

20.	X-ray diffractometers are not used to identify the physical properties of which of the following?
A.	Metals
B.	Liquids
C.	Polymeric materials
D.	Solids
Answer» C. Polymeric materials

Discussion

Explore topic-wise MCQs in Analytical Instrumentation.

In powder diffractometer, the sharpness of the lines is greatly determined by which of the following?

In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture.

In Diffractometers, line intensities depend on ______ and kind of atomic reflection centres in each set of plates.

Diffractometers are similar to which of the following?

When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce a diffracted beam.

In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _ of lines and their relative ___

With the help of which of the following equations is the distance calculated from a known wavelength of the source and measured angle?

Using the powder method of diffractometers, which of the following can be determined?

DIFFRACTOMETERS_ARE_SIMILAR_TO_WHICH_OF_THE_FOLLOWING??$

In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture.$

In_Diffractometers,_line_intensities_depend_on________and_kind_of_atomic_reflection_centres_in_each_set_of_plates.$

In_powder_diffractometer,_the_sharpness_of_the_lines_is_greatly_determined_by_which_of_the_following?

When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce diffracted beam?

In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _ of lines and their relative ___.

With the help of which of the following equations is the distance calculated from known wavelength of the source and measured angle?

Which of the following is the most common instrument for photographic recording of diffraction patterns?

In powder method, the powder sample is contained in which of the following?

Using powder method of diffractometers, which of the following can be determined?

X-ray diffractometers provide ____________ information about the compounds present in a solid sample.

X-ray diffractometers are not used to identify the physical properties of which of the following?

Explore topic-wise MCQs in Analytical Instrumentation.

In powder diffractometer, the sharpness of the lines is greatly determined by which of the following?

In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture.

In Diffractometers, line intensities depend on ______ and kind of atomic reflection centres in each set of plates.

Diffractometers are similar to which of the following?

When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce a diffracted beam.

In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________

With the help of which of the following equations is the distance calculated from a known wavelength of the source and measured angle?

Using the powder method of diffractometers, which of the following can be determined?

DIFFRACTOMETERS_ARE_SIMILAR_TO_WHICH_OF_THE_FOLLOWING??$

In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture.$

In_Diffractometers,_line_intensities_depend_on________and_kind_of_atomic_reflection_centres_in_each_set_of_plates.$

In_powder_diffractometer,_the_sharpness_of_the_lines_is_greatly_determined_by_which_of_the_following?

When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce diffracted beam?

In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________.

With the help of which of the following equations is the distance calculated from known wavelength of the source and measured angle?

Which of the following is the most common instrument for photographic recording of diffraction patterns?

In powder method, the powder sample is contained in which of the following?

Using powder method of diffractometers, which of the following can be determined?

X-ray diffractometers provide ____________ information about the compounds present in a solid sample.

X-ray diffractometers are not used to identify the physical properties of which of the following?

In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _ of lines and their relative ___

In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _ of lines and their relative ___.