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				This section includes 20 Mcqs, each offering curated multiple-choice questions to sharpen your Analytical Instrumentation knowledge and support exam preparation. Choose a topic below to get started.
| 1. | In powder diffractometer, the sharpness of the lines is greatly determined by which of the following? | 
| A. | Quality of the sample, size of the slit | 
| B. | Quality of the slit, size of the sample | 
| C. | Thickness of the slit, amount of the sample | 
| D. | Number of slits, composition of the sample | 
| Answer» C. Thickness of the slit, amount of the sample | |
| 2. | In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture. | 
| A. | True | 
| B. | False | 
| Answer» B. False | |
| 3. | In Diffractometers, line intensities depend on ______ and kind of atomic reflection centres in each set of plates. | 
| A. | Number | 
| B. | Position | 
| C. | Length | 
| D. | Distance between lines | 
| Answer» B. Position | |
| 4. | Diffractometers are similar to which of the following? | 
| A. | Optical grating spectrometer | 
| B. | Prism spectrometer | 
| C. | Photo multiplier | 
| D. | Photovoltaic cell | 
| Answer» B. Prism spectrometer | |
| 5. | When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce a diffracted beam. | 
| A. | True | 
| B. | False | 
| Answer» B. False | |
| 6. | In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________ | 
| A. | Number, length | 
| B. | Number, intensity | 
| C. | Position, length | 
| D. | Position, intensity | 
| Answer» E. | |
| 7. | With the help of which of the following equations is the distance calculated from a known wavelength of the source and measured angle? | 
| A. | Coolidge equation | 
| B. | Bragg’s equation | 
| C. | Debye equation | 
| D. | Scherrer equation | 
| Answer» C. Debye equation | |
| 8. | Using the powder method of diffractometers, which of the following can be determined? | 
| A. | Percentage of K+ | 
| B. | Percentage of Na+ and Cl- | 
| C. | Percentage of KBr and NaCl | 
| D. | Percentage of Br- | 
| Answer» D. Percentage of Br- | |
| 9. | DIFFRACTOMETERS_ARE_SIMILAR_TO_WHICH_OF_THE_FOLLOWING??$ | 
| A. | Optical grating spectrometer | 
| B. | Prism spectrometer | 
| C. | Photo multiplier | 
| D. | Photovoltaic cell | 
| Answer» B. Prism spectrometer | |
| 10. | In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture.$ | 
| A. | True | 
| B. | False | 
| Answer» B. False | |
| 11. | In_Diffractometers,_line_intensities_depend_on________and_kind_of_atomic_reflection_centres_in_each_set_of_plates.$ | 
| A. | Number | 
| B. | Position | 
| C. | Length | 
| D. | Distance between lines | 
| Answer» B. Position | |
| 12. | In_powder_diffractometer,_the_sharpness_of_the_lines_is_greatly_determined_by_which_of_the_following? | 
| A. | Quality of the sample, size of the slit | 
| B. | Quality of the slit, size of the sample | 
| C. | Thickness of the slit, amount of the sample | 
| D. | Number of slits, composition of the sample | 
| Answer» C. Thickness of the slit, amount of the sample | |
| 13. | When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce diffracted beam? | 
| A. | True | 
| B. | False | 
| Answer» B. False | |
| 14. | In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________. | 
| A. | Number, length | 
| B. | Number, intensity | 
| C. | Position, length | 
| D. | Position, intensity | 
| Answer» E. | |
| 15. | With the help of which of the following equations is the distance calculated from known wavelength of the source and measured angle? | 
| A. | Coolidge equation | 
| B. | Bragg’s equation | 
| C. | Debye equation | 
| D. | Scherrer equation | 
| Answer» C. Debye equation | |
| 16. | Which of the following is the most common instrument for photographic recording of diffraction patterns? | 
| A. | Debye-Scherrer powder camera | 
| B. | Gamma camera | 
| C. | Geiger tube | 
| D. | Scintillation counter | 
| Answer» B. Gamma camera | |
| 17. | In powder method, the powder sample is contained in which of the following? | 
| A. | Thin walled glass capillary tubes | 
| B. | Thin walled test tube | 
| C. | Thin walled curvettes | 
| D. | Thin walled flask | 
| Answer» B. Thin walled test tube | |
| 18. | Using powder method of diffractometers, which of the following can be determined? | 
| A. | Percentage of K+ | 
| B. | Percentage of Na+ and Cl- | 
| C. | Percentage of KBr and NaCl | 
| D. | Percentage of Br- | 
| Answer» D. Percentage of Br- | |
| 19. | X-ray diffractometers provide ____________ information about the compounds present in a solid sample. | 
| A. | Quantitative | 
| B. | Qualitative | 
| C. | Quantitative and qualitative | 
| D. | Either quantitative or qualitative | 
| Answer» D. Either quantitative or qualitative | |
| 20. | X-ray diffractometers are not used to identify the physical properties of which of the following? | 
| A. | Metals | 
| B. | Liquids | 
| C. | Polymeric materials | 
| D. | Solids | 
| Answer» C. Polymeric materials | |