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This section includes 14 Mcqs, each offering curated multiple-choice questions to sharpen your Analytical Instrumentation knowledge and support exam preparation. Choose a topic below to get started.
1. |
An accuracy of 1 part in 102 has been obtained in precision mass measurements. |
A. | True |
B. | False |
Answer» C. | |
2. |
Nier-Johnson geometry involves a deflection of which of the following radians in a radial electrostatic field analyser? |
A. | Π |
B. | Π/2 |
C. | Π/3 |
D. | Π/4 |
Answer» C. Π/3 | |
3. |
Which of the following is commonly varied in magnetic deflection mass spectrometer? |
A. | Electric sector |
B. | Magnetic fold strength |
C. | Magnetic constant |
D. | Electric constant |
Answer» C. Magnetic constant | |
4. |
WHICH_OF_THE_FOLLOWING_IS_COMMONLY_VARIED_IN_MAGNETIC_DEFLECTION_MASS_SPECTROMETER??$ |
A. | Electric sector |
B. | Magnetic fold strength |
C. | Magnetic constant |
D. | Electric constant |
Answer» C. Magnetic constant | |
5. |
An accuracy of 1 part in 102 has been obtained in precision mass measurements.$ |
A. | True |
B. | False |
Answer» C. | |
6. |
Nier-Johnson_geometry_involves_a_deflection_of_which_of_the_following_radians_in_a_radial$ |
A. | |
B. | Π |
C. | Π/2 |
Answer» C. ‚âà√≠‚Äö√тĆ/2 | |
7. |
Which of the following components need to be added in order to increase the resolution? |
A. | Ion source |
B. | Detector |
C. | Magnetic sector |
D. | Electric sector |
Answer» E. | |
8. |
The electric sector field is not subject to hysteresis. |
A. | True |
B. | False |
Answer» B. False | |
9. |
Which of the following leads to the limitation of resolution? |
A. | All ions do not have same energy |
B. | All ions do not have same charge |
C. | All ions are not of the same size |
D. | All ions do not have the same charge |
Answer» B. All ions do not have same charge | |
10. |
Mattauch-Herzog geometry involves a deflection of which of the following radians in a radial electrostatic field analyser? |
A. | √2Π |
B. | Π/2 |
C. | Π/3√4 |
D. | Π/4√2 |
Answer» E. | |
11. |
Which of the following separate the ions according to their mass-to-charge? |
A. | Ion source |
B. | Detector |
C. | Magnetic sector |
D. | Electric sector |
Answer» D. Electric sector | |
12. |
Direct focussing is obtained by deflecting the ion beam along a _________ trajectory through the magnetic field. |
A. | 120<sup>o</sup> |
B. | 150<sup>o</sup> |
C. | 190<sup>o</sup> |
D. | 180<sup>o</sup> |
Answer» E. | |
13. |
In magnetic deflection mass spectrometer, in which of the following ways is acceleration applied to the direction of motion? |
A. | In random manner |
B. | Parallel to it |
C. | Perpendicular to it |
D. | Along it |
Answer» D. Along it | |
14. |
Which of the following produces the electron beam in magnetic deflection mass spectrometer? |
A. | Tungsten filament |
B. | Quartz rod |
C. | Silica |
D. | Rhodium filament |
Answer» B. Quartz rod | |