Explore topic-wise MCQs in Analytical Instrumentation.

This section includes 14 Mcqs, each offering curated multiple-choice questions to sharpen your Analytical Instrumentation knowledge and support exam preparation. Choose a topic below to get started.

1.

An accuracy of 1 part in 102 has been obtained in precision mass measurements.

A. True
B. False
Answer» C.
2.

Nier-Johnson geometry involves a deflection of which of the following radians in a radial electrostatic field analyser?

A. Π
B. Π/2
C. Π/3
D. Π/4
Answer» C. Π/3
3.

Which of the following is commonly varied in magnetic deflection mass spectrometer?

A. Electric sector
B. Magnetic fold strength
C. Magnetic constant
D. Electric constant
Answer» C. Magnetic constant
4.

WHICH_OF_THE_FOLLOWING_IS_COMMONLY_VARIED_IN_MAGNETIC_DEFLECTION_MASS_SPECTROMETER??$

A. Electric sector
B. Magnetic fold strength
C. Magnetic constant
D. Electric constant
Answer» C. Magnetic constant
5.

An accuracy of 1 part in 102 has been obtained in precision mass measurements.$

A. True
B. False
Answer» C.
6.

Nier-Johnson_geometry_involves_a_deflection_of_which_of_the_following_radians_in_a_radial$

A.
B. Π
C. Π/2
Answer» C. ‚âà√≠‚Äö√тĆ/2
7.

Which of the following components need to be added in order to increase the resolution?

A. Ion source
B. Detector
C. Magnetic sector
D. Electric sector
Answer» E.
8.

The electric sector field is not subject to hysteresis.

A. True
B. False
Answer» B. False
9.

Which of the following leads to the limitation of resolution?

A. All ions do not have same energy
B. All ions do not have same charge
C. All ions are not of the same size
D. All ions do not have the same charge
Answer» B. All ions do not have same charge
10.

Mattauch-Herzog geometry involves a deflection of which of the following radians in a radial electrostatic field analyser?

A. √2Π
B. Π/2
C. Π/3√4
D. Π/4√2
Answer» E.
11.

Which of the following separate the ions according to their mass-to-charge?

A. Ion source
B. Detector
C. Magnetic sector
D. Electric sector
Answer» D. Electric sector
12.

Direct focussing is obtained by deflecting the ion beam along a _________ trajectory through the magnetic field.

A. 120<sup>o</sup>
B. 150<sup>o</sup>
C. 190<sup>o</sup>
D. 180<sup>o</sup>
Answer» E.
13.

In magnetic deflection mass spectrometer, in which of the following ways is acceleration applied to the direction of motion?

A. In random manner
B. Parallel to it
C. Perpendicular to it
D. Along it
Answer» D. Along it
14.

Which of the following produces the electron beam in magnetic deflection mass spectrometer?

A. Tungsten filament
B. Quartz rod
C. Silica
D. Rhodium filament
Answer» B. Quartz rod