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This section includes 10 Mcqs, each offering curated multiple-choice questions to sharpen your Manufacturing Processes knowledge and support exam preparation. Choose a topic below to get started.
1. |
IN_THE_BEGINNING_OF_THE_ELECTROCHEMICAL_ETCHING,_SOME_OF_THESE_PITS_PRESENT_ON_THE_SURFACE_OF_THE_SILICON_WAFER_DEVELOP_INTO_MESOPORES.?$ |
A. | True |
B. | False |
Answer» B. False | |
2. |
THE_ELECTRIC_FIELD_STRENGTH_DECREASES_AROUND_THE_DEPRESSIONS_PRESENT_ON_THE_SILICON_WAFER_SURFACE.?$ |
A. | True |
B. | False |
Answer» C. | |
3. |
Avalanche breakdown is the dominant mechanism at high doping densities? |
A. | True |
B. | False |
Answer» C. | |
4. |
When the doping density in the silicon wafer is increased, then _____ |
A. | electric field strength is increased |
B. | width of depletion region is increased |
C. | hinderance to charge carries is increased |
D. | quality of the product is increased |
Answer» B. width of depletion region is increased | |
5. |
Arrays of cone-like silicon dioxide pillars can be produced using _____ |
A. | truncated MpSi |
B. | conical MpSi |
C. | cylindrical MpSi |
D. | planner MpSi |
Answer» C. cylindrical MpSi | |
6. |
It possible to produce arrays of silicon dioxide pillars inside _____ |
A. | long pipes |
B. | spherical cavities |
C. | truncated pyramids |
D. | thin shells |
Answer» D. thin shells | |
7. |
Lithographic technique can be used for patterning the Si wafer. |
A. | True |
B. | False |
Answer» B. False | |
8. |
Length of the silicon dioxide pillars is dependant on the etching time and the pore length. |
A. | True |
B. | False |
Answer» B. False | |
9. |
Silicon oxide layer can be removed using HF solution. |
A. | True |
B. | False |
Answer» B. False | |
10. |
Bending curvature of silicon wafers varies ______ with the specific area of the MpSi structure. |
A. | linearly |
B. | inversely |
C. | cubically |
D. | it not affected by specific area |
Answer» B. inversely | |