MCQOPTIONS
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MCQOPTIONS
This section includes 12 Mcqs, each offering curated multiple-choice questions to sharpen your Analytical Instrumentation knowledge and support exam preparation. Choose a topic below to get started.
| 1. |
Which of the following is the abbreviation of SIMS? |
| A. | Secondary ion mass spectroscopy |
| B. | Spectrum ionization mass spectroscopy |
| C. | Scattering ions mass spectroscopy |
| D. | Spectral ionization mass spectroscopy |
| Answer» B. Spectrum ionization mass spectroscopy | |
| 2. |
Which of the following methods use soft X-rays to eject electrons from inner shell orbitals? |
| A. | Auger electron spectroscopy |
| B. | Electron impact spectroscopy |
| C. | Electron spectroscopy for chemical analysis |
| D. | Secondary ion mass spectroscopy |
| Answer» D. Secondary ion mass spectroscopy | |
| 3. |
WHICH_OF_THE_FOLLOWING_METHODS_USE_SOFT_X-RAYS_TO_EJECT_ELECTRONS_FROM_INNER_SHELL_ORBITALS??$ |
| A. | Auger electron spectroscopy |
| B. | Electron impact spectroscopy |
| C. | Electron spectroscopy for chemical analysis |
| D. | Secondary ion mass spectroscopy |
| Answer» D. Secondary ion mass spectroscopy | |
| 4. |
Which_of_the_following_is_the_abbreviation_of_SIMS?$ |
| A. | Secondary ion mass spectroscopy |
| B. | Spectrum ionization mass spectroscopy |
| C. | Scattering ions mass spectroscopy |
| D. | Spectral ionization mass spectroscopy |
| Answer» B. Spectrum ionization mass spectroscopy | |
| 5. |
Which of the following is the abbreviation of ESCA? |
| A. | Electron scattering chemical analysis |
| B. | Emission spectroscopy combination analysis |
| C. | Electron spectroscopy for chemical analysis |
| D. | Electron spectrum chemically analysed |
| Answer» D. Electron spectrum chemically analysed | |
| 6. |
Which of the following methods utilizes the emission of low energy electrons in a process? |
| A. | Auger electron spectroscopy |
| B. | Electron impact spectroscopy |
| C. | Electron spectroscopy for chemical analysis |
| D. | Secondary ion mass spectroscopy |
| Answer» B. Electron impact spectroscopy | |
| 7. |
Which of the following is also known as X-ray photoelectron spectroscopy? |
| A. | Auger electron spectroscopy |
| B. | Electron impact spectroscopy |
| C. | Electron spectroscopy for chemical analysis |
| D. | Secondary ion mass spectroscopy |
| Answer» D. Secondary ion mass spectroscopy | |
| 8. |
Surface analysis cannot provide any chemical information directly. |
| A. | True |
| B. | False |
| Answer» C. | |
| 9. |
Which of the following is a type of electron spectroscopy? |
| A. | MIKES |
| B. | Auger spectroscopy |
| C. | Secondary ion mass spectroscopy |
| D. | Ion scattering spectroscopy |
| Answer» C. Secondary ion mass spectroscopy | |
| 10. |
In surface spectrometer, which of the following beam is analysed? |
| A. | Reflected beam |
| B. | Absorbed beam |
| C. | Refracted beam |
| D. | Incident beam |
| Answer» B. Absorbed beam | |
| 11. |
Surface analysis can provide information that classic methods like microscopic cannot. |
| A. | True |
| B. | False |
| Answer» B. False | |
| 12. |
Surface is usually more than _____ atomic layer deep and is a region of ________ atomic potentials. |
| A. | One, uniform |
| B. | One, non-uniform |
| C. | Two, uniform |
| D. | Two, non-uniform |
| Answer» C. Two, uniform | |