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This section includes 335 Mcqs, each offering curated multiple-choice questions to sharpen your Power Electronics knowledge and support exam preparation. Choose a topic below to get started.
251. |
Printer in which printing head and paper is forced together to form the letters is called |
A. | impact printer |
B. | non impact printer |
C. | page printers |
D. | line printers |
Answer» B. non impact printer | |
252. |
Printer which is used to produce low-cost posters and handouts is |
A. | dye-sublimation |
B. | thermal-wax |
C. | laser |
D. | inkjet |
Answer» B. thermal-wax | |
253. |
Types of computer impact printer are |
A. | dot matrix printers |
B. | daisy wheel printers |
C. | line printers |
D. | all of these |
Answer» E. | |
254. |
Scanning technology, used in banks to read the numbers at the bottom of checks is |
A. | MICR |
B. | OCR |
C. | OMR |
D. | GRE |
Answer» B. OCR | |
255. |
The OCR is used for the preparation of |
A. | electricity bills |
B. | insurance premium |
C. | telephone bills |
D. | all of these |
Answer» E. | |
256. |
Hand-held device which is used to pick options that are displayed on a computer screen is known as |
A. | keyboard |
B. | mouse |
C. | joystick |
D. | stylus pen |
Answer» C. joystick | |
257. |
Laser Jet printer speeds are measured in pages per minute (ppm). what do we use to measure dot-matrix printers? |
A. | lines per inch |
B. | lines per sheet |
C. | characters per inch |
D. | characters per second |
Answer» E. | |
258. |
Higher the magnitude of the gate pulse |
A. | lesser is the time required to inject the charges |
B. | greater is the time required to inject the charges |
C. | greater is the value of anode current |
D. | lesser is the value of anode current |
Answer» B. greater is the time required to inject the charges | |
259. |
For a power transistor, if the base current IB is increased keeping VCE constant, then |
A. | IC increases |
B. | IC decreases |
C. | IC remains constant |
D. | none of the mentioned |
Answer» B. IC decreases | |
260. |
For a power transistor, if the forward current gain α = 0.97, then β = ? |
A. | 0.03 |
B. | 2.03 |
C. | 49.24 |
D. | 32.33 |
Answer» E. | |
261. |
In a GTO the n+ layer forms the |
A. | anode & gate |
B. | cathode & gate |
C. | cathode |
D. | gate |
Answer» D. gate | |
262. |
For an SCR the total turn-on time consists ofi) Delay timeii) Rise time andiii) Spread timeDuring the delay time the |
A. | anode current flows only near the gate |
B. | anode current rises from zero to very high value |
C. | losses are maximum |
D. | anode to cathode voltage is zero |
Answer» B. anode current rises from zero to very high value | |
263. |
With the anode positive with respect to the cathode & the gate circuit open, the SCR is said to be in the |
A. | reverse blocking mode |
B. | reverse conduction mode |
C. | forward blocking mode |
D. | forward conduction mode |
Answer» D. forward conduction mode | |
264. |
The DIAC can be represented by |
A. | two SCRs in anti-parallel |
B. | two SCRs in parallel |
C. | two diodes in anti-parallel |
D. | two diodes in parallel |
Answer» D. two diodes in parallel | |
265. |
The major drawback of the first generation IGBTs was that, they had |
A. | latch-up problems |
B. | noise & secondary breakdown problems |
C. | sluggish operation |
D. | latch-up & secondary breakdown problems |
Answer» E. | |
266. |
The maximum rms current of an SCR is 50 A. For a 120° sine wave conduction the form factor (FF) = 1.878Find the average on-state current rating (ITAV). |
A. | 93.9 A |
B. | 174 A |
C. | 26.62 A |
D. | 68.52 A |
Answer» D. 68.52 A | |
267. |
In the internal structure of a MOSFET, a parasitic BJT exists between the |
A. | source & gate terminals |
B. | source & drain terminals |
C. | drain & gate terminals |
D. | there is no parasitic BJT in MOSFET |
Answer» C. drain & gate terminals | |
268. |
The output characteristics of a MOSFET, is a plot of |
A. | Id as a function of Vgs with Vds as a parameter |
B. | Id as a function of Vds with Vgs as a parameter |
C. | Ig as a function of Vgs with Vds as a parameter |
D. | Ig as a function of Vds with Vgs as a parameter |
Answer» C. Ig as a function of Vgs with Vds as a parameter | |
269. |
The sink to ambient thermal resistance of SCR θsA |
A. | depends on the flatness of the device |
B. | depends on the length of the device |
C. | depends on the current carrying capabilities |
D. | is independent on thyristor configuration |
Answer» E. | |
270. |
In IGBT, the n– layer above the p+ layer is called as the |
A. | drift layer |
B. | injection layer |
C. | body layer |
D. | collector Layer |
Answer» B. injection layer | |
271. |
In a power transistor, the IB vs VBE curve is |
A. | a parabolic curve |
B. | an exponentially decaying curve |
C. | resembling the diode curve |
D. | a straight line Y = IB |
Answer» D. a straight line Y = IB | |
272. |
For an SCR the total turn-on time consists ofi) Delay timeii) Rise time and theiii) Spread timeThe spread time interval depends upon |
A. | the value of gate current |
B. | junction temperature |
C. | area of the cathode |
D. | area of the anode |
Answer» D. area of the anode | |
273. |
Latching current for an SCR is 100 mA, DC source of 200 V is also connected from the SCR to the L load. Compute the minimum width of the gate pulse required to turn on the device. Take L = 0.2 H. |
A. | 50 μsec |
B. | 100 μsec |
C. | 150 μsec |
D. | 200 μsec |
Answer» C. 150 μsec | |
274. |
The total thermal resistance between junction and ambient θjA is 10°C/W. θjc is 2°C/W. θcs is 4°C/W. θsA = ? |
A. | 4°C/W |
B. | 2°C/W |
C. | 10°C/W |
D. | 16°C/W |
Answer» B. 2°C/W | |
275. |
The RCT (Reverse Conducting Thyristor) has |
A. | a diode in series with the SCR |
B. | a diode in anti-parallel with the SCR |
C. | two SCR's in anti-parallel |
D. | none of the mentioned |
Answer» C. two SCR's in anti-parallel | |
276. |
At present, the state-of-the-art semiconductor devices are begin manufactured using |
A. | Semiconducting Diamond |
B. | Gallium-Arsenide |
C. | Germanium |
D. | Silicon-Carbide |
Answer» E. | |
277. |
The SOA for a MOSFET is plotted for |
A. | Id versus Vds |
B. | Ig versus Id |
C. | Ig versus Vds |
D. | Id versus Vgs |
Answer» B. Ig versus Id | |
278. |
The amp2-sec rating of the SCR specifies |
A. | The power dissipated by the device when fault occurs |
B. | The energy dissipated by the device when fault occurs |
C. | The energy that the device can absorb before the fault is cleared |
D. | The energy that the device can absorb while operating in the forward blocking mode. |
Answer» D. The energy that the device can absorb while operating in the forward blocking mode. | |
279. |
A GTO can be represented by two transistors T1 & T2. The current gain of both transistors are α1 and α2 respectively. A low value of gate current requires |
A. | low value of α1 and α2 |
B. | low value of α1 and high value of α2 |
C. | high value of α1 and low value of α2 |
D. | high values of α1 and α2 |
Answer» C. high value of α1 and low value of α2 | |
280. |
The value of anode current required to maintain the conduction of an SCR even though the gate signal is removed is called as the |
A. | holding current |
B. | latching current |
C. | switching current |
D. | peak anode current |
Answer» C. switching current | |
281. |
For an SCR in the forward blocking mode (practically) |
A. | leakage current does not flow |
B. | leakage current flows from anode to cathode |
C. | leakage current flows from cathode to anode |
D. | leakage current flows from gate to anode |
Answer» C. leakage current flows from cathode to anode | |
282. |
The voltage safety factor (VSF) for an SCR is the ratio of |
A. | peak working voltage & peak reverse repetitive voltage |
B. | dv/dt & di/dt |
C. | peak repetitive reverse voltage & maximum value of input voltage |
D. | peak repetitive reverse voltage & rms value of input voltage |
Answer» D. peak repetitive reverse voltage & rms value of input voltage | |
283. |
The area under the curve of the gate characteristics of thyristor gives the |
A. | total average gate current |
B. | total average gate voltage |
C. | total average gate impedance |
D. | total average gate power dissipation |
Answer» E. | |
284. |
For an SCR the average & rms values of current are I/4 & I/2 respectively. Calculate the average on-state current rating (ITAV). Take maximum RMS on-state current = 35 A. |
A. | 8.78 A |
B. | 10.10 A |
C. | 17.5 A |
D. | 24.74 A |
Answer» D. 24.74 A | |
285. |
In IGBT, the p+ layer connected to the collector terminal is called as the |
A. | drift layer |
B. | injection layer |
C. | body layer |
D. | collector Layer |
Answer» C. body layer | |
286. |
The value of β is given by the expression |
A. | IC/IB |
B. | IC/IE |
C. | IE/IC |
D. | IE/IB |
Answer» B. IC/IE | |
287. |
A tangent drawn from the Y-axis to the Pavg on the gate characteristics gives the value of the |
A. | maximum value of gate-source resistance |
B. | minimum value of gate-source resistance |
C. | maximum value of gate-source power |
D. | minimum value of gate-source power |
Answer» C. maximum value of gate-source power | |
288. |
From the two transistor (T1 & T2) analogy of SCR, the total anode current of SCR is ___________ in the equivalent circuit. |
A. | the sum of both the base currents |
B. | the sum of both the collector current |
C. | the sum of base current of T1 & collector current of T2 |
D. | the sum of base current of T2 & collector current of T1 |
Answer» C. the sum of base current of T1 & collector current of T2 | |
289. |
The two transistor model of the SCR can obtained by |
A. | bisecting the SCR vertically |
B. | bisecting the SCR horizontally |
C. | bisecting the SCRs top two & bottom two layers |
D. | bisecting the SCRs middle two layers |
Answer» E. | |
290. |
False triggering of the SCRs by varying flux & noise is avoided by using |
A. | F.A.C.L.F & C.B |
B. | Shielded cables & twisted gate leads |
C. | Snubber circuits |
D. | di/dt inductor in series with the gate terminal |
Answer» C. Snubber circuits | |
291. |
An IGBT is also know as |
A. | MOIGT (Metal oxide insulated gate transistor) |
B. | COMFET (Conductively modulated FET) |
C. | GEMFET (Grain modulated FET) |
D. | all of the mentioned |
Answer» E. | |
292. |
In the ___________ type of mounting the SCR is pressed between two heat sinks |
A. | bolt-down mounting |
B. | stud-mounting |
C. | press-pak mounting |
D. | cross-fit mounting |
Answer» D. cross-fit mounting | |
293. |
The SITH is a |
A. | normally-off device |
B. | normally-on device |
C. | uncontrollable device |
D. | none of the mentioned |
Answer» C. uncontrollable device | |
294. |
The SITH (Static Induction Thyristor) is a |
A. | 4 terminal, self-controlled device |
B. | 3 terminal, self-controlled device |
C. | 4 terminal, un-controllable device |
D. | 3 terminal, un-controllable device |
Answer» C. 4 terminal, un-controllable device | |
295. |
The average gate power dissipation for an SCR is 0.5 Watts the voltage applied to the gate is Vg = 10 V. What is the maximum value of current Ig for safe operation? |
A. | 0.25 A |
B. | 10 A |
C. | 0.05 A |
D. | 0.1 A |
Answer» D. 0.1 A | |
296. |
Thyristors are used in electronic crowbar protection circuits because it possesses |
A. | high surge current capabilities |
B. | high amp 2-sec rating |
C. | less switching losses |
D. | voltage clamping properties |
Answer» B. high amp 2-sec rating | |
297. |
Two parallel connect SCRs have same voltage drop (Vt) having rated current = 2I1. SCR-1 carries a current of I1=2.6 A whereas SCR-2 carries a current of I2=1.4 A. Find the string efficiency. |
A. | 0.45 |
B. | 0.77 |
C. | 0.92 |
D. | 0.84 |
Answer» C. 0.92 | |
298. |
The SITH |
A. | has high reverse blocking capabilities as compared to CTs |
B. | has low reverse blocking capabilities as compared to CTs |
C. | has no reverse blocking capabilities |
D. | none of the mentioned |
Answer» D. none of the mentioned | |
299. |
Let's say that a transistor is operating at the middle of the load line, then a decrease in the current gain would |
A. | move the Q point up |
B. | move the Q point down |
C. | result in to & fro motion of the Q point |
D. | not change the Q point |
Answer» C. result in to & fro motion of the Q point | |
300. |
Pav x (θjc + θcs + θsA) = |
A. | Maximum specified temperature |
B. | Energy lost |
C. | Difference in temperature between junction & ambient |
D. | Sum of junction & ambient temperature |
Answer» D. Sum of junction & ambient temperature | |