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This section includes 15 Mcqs, each offering curated multiple-choice questions to sharpen your Electronic Devices Circuits knowledge and support exam preparation. Choose a topic below to get started.
1. |
Which of the below issues may not be experienced when using MOSFETs? |
A. | Weak avalanche |
B. | Velocity saturation |
C. | Punch-through |
D. | All of the mentioned |
Answer» E. | |
2. |
In MOSFETs a breakdown may occur at around 30 V. This is due to |
A. | Velocity saturation |
B. | Breakdown of the gate diode |
C. | Sudden decrease in the depletion region |
D. | Fall of the threshold voltage due to impurities |
Answer» C. Sudden decrease in the depletion region | |
3. |
At ______________ the drain current is no longer related to the Vgs by square law relationship. |
A. | When the temperature is high (around 700 Celsius) |
B. | When temperature is very low (around -50 Celsius) |
C. | Velocity saturation |
D. | None of the mentioned |
Answer» D. None of the mentioned | |
4. |
The threshold voltage is |
A. | Increases on increasing temperature |
B. | May increase or decrease on increasing temperature depending upon other factors |
C. | Temperature independent |
D. | Decreases on increasing temperature |
Answer» E. | |
5. |
An NMOS transistor has Vt0 = 0.8 V, 2 φf = 0.7 V, and γ = 0.4 V1/2. Find Vt when VSB = 3 V. |
A. | 0.12 V |
B. | 1.23 V |
C. | 2.34 V |
D. | 3.45 V |
Answer» C. 2.34 V | |
6. |
WHICH_OF_THE_BELOW_ISSUES_MAY_NOT_BE_EXPERIENCED_WHEN_USING_MOSFETS??$ |
A. | Weak avalanche |
B. | Velocity saturation |
C. | Punch-through |
D. | All of the mentioned |
Answer» E. | |
7. |
IN_MOSFETS_A_BREAKDOWN_MAY_OCCUR_AT_AROUND_30_V._THIS_IS_DUE_TO?$ |
A. | Velocity saturation |
B. | Breakdown of the gate diode |
C. | Sudden decrease in the depletion region |
D. | Fall of the threshold voltage due to impurities |
Answer» C. Sudden decrease in the depletion region | |
8. |
At ______________ the drain current is no longer related to the Vgs by square law relationship? |
A. | When the temperature is high (around 700 Celsius) |
B. | When temperature is very low (around -50 Celsius) |
C. | Velocity saturation |
D. | None of the mentioned |
Answer» D. None of the mentioned | |
9. |
A breakdown effect that occurs in modern devices at low voltages (of around 20 V) is |
A. | Weak avalanche |
B. | Strong avalanche |
C. | Weak storm |
D. | Punch-through |
Answer» E. | |
10. |
As the voltage on the drain is increased, a value is reached at which the pn junction between the drain region and substrate suffers avalanche breakdown known as |
A. | Weak avalanche |
B. | Strong avalanche |
C. | Weak storm |
D. | Punch-through |
Answer» B. Strong avalanche | |
11. |
The threshold voltage is |
A. | Increases on increasing temperature |
B. | May increase or decrease on increasing temperature depending upon other factors |
C. | Temperature independent |
D. | Decreases on increasing temperature |
Answer» E. | |
12. |
An NMOS transistor has Vt0 = 0.8 V, 2 φf = 0.7 V, and γ = 0.4 V1/2. Find Vt when VSB = 3 V.$ |
A. | 0.12 V |
B. | 1.23 V |
C. | 2.34 V |
D. | 3.45 V |
Answer» C. 2.34 V | |
13. |
The SI units of the body effect parameter is |
A. | Volt |
B. | Volt X Volt |
C. | ‚àöVolt |
D. | It has no units |
Answer» D. It has no units | |
14. |
The variation of the threshold voltage with the applied bulk-to-source voltage is typically observed by plotting the _________________ as a function of the source-to-drain voltage. |
A. | drain current |
B. | square root of the drain current |
C. | square of the drain current |
D. | natural logarithm of the drain current |
Answer» C. square of the drain current | |
15. |
The _____________ of a MOSFET is affected by the voltage which is applied to the back contact. |
A. | Threshold Voltage |
B. | Output Voltage |
C. | Both threshold and output voltage |
D. | Neither of the threshold nor the output voltage |
Answer» B. Output Voltage | |