 
			 
			MCQOPTIONS
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				This section includes 7 Mcqs, each offering curated multiple-choice questions to sharpen your General Awareness knowledge and support exam preparation. Choose a topic below to get started.
| 1. | MTTR is the best way to characterize | 
| A. | Availability | 
| B. | Reliability | 
| C. | Fault Tolerance | 
| D. | Dependability | 
| Answer» B. Reliability | |
| 2. | Which one of the availability criteria is optimal for carrier grade class systems? | 
| A. | 40 seconds of down time per year | 
| B. | 40 minutes of down time per year | 
| C. | 10 minutes of down time per year | 
| D. | 10 seconds of down time per year | 
| Answer» B. 40 minutes of down time per year | |
| 3. | The common mechanism used to find latent failure in memory modules: | 
| A. | Sniffing | 
| B. | Scrubbing | 
| C. | Swapping | 
| D. | Paging | 
| Answer» B. Scrubbing | |
| 4. | Which of the operating system architecture is suitable for FT based systems? | 
| A. | A – Monolithic Kernel | 
| B. | B – Micro Kernel | 
| C. | C – Real Time Kernel | 
| D. | D – All of the mentioned | 
| Answer» C. C – Real Time Kernel | |
| 5. | Which one of the property is NOT a requirement for Fault Tolerance? | 
| A. | Fault Containments | 
| B. | Fault Isolation | 
| C. | Dynamic Recovery | 
| D. | Fail Safe | 
| Answer» E. | |
| 6. | If X is the MTBF of a system and Y is the failure rate of the system then which one is true? | 
| A. | X * Y = 1 | 
| B. | X = Y | 
| C. | NX = Y, where N is the life time | 
| D. | X/Y = N, where N is the life time | 
| Answer» B. X = Y | |
| 7. | Which is the most common cause of soft errors in hardware? | 
| A. | Thermal Issue | 
| B. | Cosmic Rays | 
| C. | Alpha Particile | 
| D. | Voltage Fluctuation | 
| Answer» C. Alpha Particile | |