MCQOPTIONS
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This section includes 7 Mcqs, each offering curated multiple-choice questions to sharpen your General Awareness knowledge and support exam preparation. Choose a topic below to get started.
| 1. |
MTTR is the best way to characterize |
| A. | Availability |
| B. | Reliability |
| C. | Fault Tolerance |
| D. | Dependability |
| Answer» B. Reliability | |
| 2. |
Which one of the availability criteria is optimal for carrier grade class systems? |
| A. | 40 seconds of down time per year |
| B. | 40 minutes of down time per year |
| C. | 10 minutes of down time per year |
| D. | 10 seconds of down time per year |
| Answer» B. 40 minutes of down time per year | |
| 3. |
The common mechanism used to find latent failure in memory modules: |
| A. | Sniffing |
| B. | Scrubbing |
| C. | Swapping |
| D. | Paging |
| Answer» B. Scrubbing | |
| 4. |
Which of the operating system architecture is suitable for FT based systems? |
| A. | A – Monolithic Kernel |
| B. | B – Micro Kernel |
| C. | C – Real Time Kernel |
| D. | D – All of the mentioned |
| Answer» C. C – Real Time Kernel | |
| 5. |
Which one of the property is NOT a requirement for Fault Tolerance? |
| A. | Fault Containments |
| B. | Fault Isolation |
| C. | Dynamic Recovery |
| D. | Fail Safe |
| Answer» E. | |
| 6. |
If X is the MTBF of a system and Y is the failure rate of the system then which one is true? |
| A. | X * Y = 1 |
| B. | X = Y |
| C. | NX = Y, where N is the life time |
| D. | X/Y = N, where N is the life time |
| Answer» B. X = Y | |
| 7. |
Which is the most common cause of soft errors in hardware? |
| A. | Thermal Issue |
| B. | Cosmic Rays |
| C. | Alpha Particile |
| D. | Voltage Fluctuation |
| Answer» C. Alpha Particile | |