MCQOPTIONS
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MCQOPTIONS
This section includes 68 Mcqs, each offering curated multiple-choice questions to sharpen your Textile Engineering knowledge and support exam preparation. Choose a topic below to get started.
| 51. |
Surface detail can be studied using |
| A. | scanning electron microscope |
| B. | electron microscope |
| C. | scanning proton microscope |
| D. | proton microscope |
| Answer» B. electron microscope | |
| 52. |
Sizes of spot in scanning electron microscopy has been |
| A. | reduced |
| B. | increased |
| C. | constant |
| D. | variable |
| Answer» B. increased | |
| 53. |
Electrons can be focused by bending their paths in |
| A. | electric field |
| B. | magnetic field |
| C. | both a and b |
| D. | electromagnetic field |
| Answer» D. electromagnetic field | |
| 54. |
Deflection of cantilever in atomic force microscopy can be seen as |
| A. | a line showing the surface profile |
| B. | scanning over an area |
| C. | conversion of response to a grey scale |
| D. | all of above |
| Answer» E. | |
| 55. |
Television screen used in scanning electron microscope for image display is scanned synchronously with the |
| A. | array |
| B. | spot |
| C. | spectrum |
| D. | layers |
| Answer» C. spectrum | |
| 56. |
In scanning electron microscope, fine spot of electron is transversed across the |
| A. | ion |
| B. | molecule |
| C. | specimen |
| D. | electron |
| Answer» D. electron | |
| 57. |
For electron microscopy, specimen must be thin to |
| A. | allow passage of electrons |
| B. | avoid confusion from the great depths |
| C. | both a and b |
| D. | allow passage of electrons and protons |
| Answer» D. allow passage of electrons and protons | |
| 58. |
In scanning electron microscope method, electrons are picked up by |
| A. | collector |
| B. | scanner |
| C. | electron tray |
| D. | container |
| Answer» B. scanner | |
| 59. |
Atomic force microscopy consists of |
| A. | probe |
| B. | minute tip |
| C. | cantilever arm rests |
| D. | all of above |
| Answer» E. | |
| 60. |
Electron microscope can form an image with a limited resolution far smaller than possible with |
| A. | optical microscope |
| B. | electron microscope |
| C. | microscope |
| D. | light microscope |
| Answer» B. electron microscope | |
| 61. |
For obtaining useful information from replicas, it is obtained from |
| A. | cut face of fibre |
| B. | fibre surface made up of other suitable material |
| C. | other fibre surface replicated from original |
| D. | all of above |
| Answer» E. | |
| 62. |
Broadband width depends on how firmly held is the |
| A. | atom |
| B. | resonating atom |
| C. | molecule |
| D. | resonating molecule |
| Answer» C. molecule | |
| 63. |
Value of field in which atom is placed to resonate is calculated to be |
| A. | 2.0 tesla oscillating at 60 MHz |
| B. | 1.5 tesla oscillating at 60 MHz |
| C. | 2.5 tesla oscillating at 60 MHz |
| D. | 1.0 tesla oscillating at 60 MHz |
| Answer» C. 2.5 tesla oscillating at 60 MHz | |
| 64. |
Image in scanning electron microscope is formed on a |
| A. | computer |
| B. | television screen |
| C. | slide |
| D. | tray |
| Answer» C. slide | |
| 65. |
Scanning allows images to be formed from |
| A. | other signals |
| B. | same signals |
| C. | diffused signals |
| D. | diffracted signals |
| Answer» B. same signals | |
| 66. |
Three dimensional tomographic reconstruction produced can be viewed at any |
| A. | angle |
| B. | measurement |
| C. | size and angle |
| D. | measurement and angle |
| Answer» E. | |
| 67. |
Method for viewing thin specimens can be altered by using |
| A. | reflected ions |
| B. | reflected neutrons |
| C. | reflected protons |
| D. | reflected electrons |
| Answer» E. | |
| 68. |
Medium to high magnification is beyond limit of |
| A. | optical microscope |
| B. | electronic microscope |
| C. | scanning microscope |
| D. | magnetic microscope |
| Answer» B. electronic microscope | |